User`s manual

• Serial E(E)PROM: 24Cxxx, 24Fxxx, 25Cxxx, 45Dxxx,
59Cxxx, 25Fxxx, 25Pxxx, 85xxx, 93Cxxx, NVM3060, MDAxxx
series, full support for LV series
• Configuration (EE)PROM: XCFxxx, XC17xxxx, XC18Vxxx,
EPCxxx, AT17xxx, 37LVxx
• 1-Wire E(E)PROM: DS1xxx, DS2xxx
• PROM: AMD, Harris, National, Philips/Signetics, Tesla, TI
• NV RAM: Dallas DSxxx, SGS/Inmos MKxxx, SIMTEK
STKxxx, XICOR 2xxx, ZMD U63x series
• PLD: Altera: MAX 3000A, MAX 7000A, MAX 7000B, MAX
7000S, MAX7000AE
• PLD: Lattice: ispGAL22V10x, ispLSI1xxx, ispLSI1xxxEA,
ispLSI2xxx, ispLSI2xxxA, ispLSI2xxxE, ispLSI2xxxV,
ispLSI2xxxVE, ispLSI2xxxVL, LC4xxxB/C/V/ZC, M4-xx/xx,
M4A3-xx/xx, M4A5-xx/xx, M4LV-xx/xx
• PLD: Xilinx: XC9500, XC9500XL, XC9500XV, CoolRunner
XPLA3, CoolRunner-II
• other PLD: SPLD/CPLD series: AMI, Atmel, AMD-Vantis,
Gould, Cypress, ICT, Lattice, NS, Philips, STM, VLSI, TI
• Microcontrollers 48 series: 87x41, 87x42, 87x48, 87x49,
87x50 series
• Microcontrollers 51 series: 87xx, 87Cxxx, 87LVxx, 89Cxxx,
89Sxxx, 89LVxxx, all manufacturers, Philips 87C748..752
series, Philips LPC series, Cygnal/Silicon Laborat. C8051
series
• Microcontrollers Intel 196 series: 87C196
KB/KC/KD/KT/KR/...
• Microcontrollers Atmel AVR: AT90Sxxxx, ATtiny, ATmega
series
• Microcontrollers Cypress: CY8Cxxxxx
• Microcontrollers ELAN: EM78Pxxx
• Microcontrollers Microchip PICmicro: PIC10xxx, PIC12xxx,
PIC16xxx, PIC17Cxxx, PIC18xxx, dsPIC series
• Microcontrollers Motorola: 68HC05, 68HC08, 68HC11 series
• Microcontrollers National: COP8xxx series
• Microcontrollers NEC: uPD78Pxxx series
• Microcontrollers Scenix (Ubicom): SXxxx series
• Microcontrollers SGS-Thomson: ST6xx, ST7xx, ST10xx
series
• Microcontrollers TI: MSP430 and MSC121x series
• Microcontrollers ZILOG: Z86/Z89xxx and Z8xxx series
• Microcontrollers other: EM Microelectronic, Fujitsu, Goal
Semiconductor, Princeton, Macronix, Winbond, Hitachi,
Holtek, Infineon(Siemens), NEC, Samsung, Toshiba, ...
I.C. Tester
• TTL type: 54,74 S/LS/ALS/H/HC/HCT series
• CMOS type: 4000, 4500 series
• static RAM: 6116.. 624000
• user definable test pattern generation
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