Datasheet

181
AT8xC51SND1C
4109E–8051–06/03
Electrical Characteristics
Absolute Maximum Rating
DC Characteristics
Digital Logic
Storage Temperature ......................................... -65 to +150°C
Voltage on any other Pin to V
SS ....................................
-0.3 to +4.0 V
I
OL
per I/O Pin ................................................................. 5 mA
Power Dissipation............................................................. 1 W
Operating Conditions
Ambient Temperature Under Bias........................ -40 to +85°C
V
DD .........................................................................................................
2.7 to 3.3V
*NOTICE: Stressing the device beyond the “Absolute Maxi-
mum Ratings” may cause permanent damage.
These are stress ratings only. Operation beyond
the “operating conditions” is not recommended
and extended exposure beyond the “Operating
Conditions” may affect device reliability.
Table 153. Digital DC Characteristics
VDD = 2.7 to 3.3 V, TA = -40 to +85°C
Symbol Parameter Min Typ
(1)
Max Units Test Conditions
V
IL
Input Low Voltage -0.5 0.2·V
DD
-0.1 V
V
IH1
(2)
Input High Voltage (except RST, X1) 0.2·V
DD
+1.1 V
DD
V
V
IH2
Input High Voltage (RST, X1) 0.7·V
DD
V
DD
+0.5 V
V
OL1
Output Low Voltage
(except P0, ALE, MCMD, MDAT, MCLK,
SCLK, DCLK, DSEL, DOUT)
0.45 V I
OL
= 1.6 mA
V
OL2
Output Low Voltage
(P0, ALE, MCMD, MDAT, MCLK, SCLK,
DCLK, DSEL, DOUT)
0.45 V I
OL
= 3.2 mA
V
OH1
Output High Voltage
(P1, P2, P3, P4 and P5)
V
DD
-0.7 V I
OH
= -30 µA
V
OH2
Output High Voltage
(P0, P2 address mode, ALE, MCMD,
MDAT, MCLK, SCLK, DCLK, DSEL,
DOUT, D+, D-)
V
DD
-0.7 V I
OH
= -3.2 mA
I
IL
Logical 0 Input Current (P1, P2, P3, P4
and P5)
-50 µA Vin = 0.45 V
I
LI
Input Leakage Current (P0, ALE, MCMD,
MDAT, MCLK, SCLK, DCLK, DSEL,
DOUT)
10 µA 0.45< V
IN
< V
DD
I
TL
Logical 1 to 0 Transition Current
(P1, P2, P3, P4 and P5)
-650 µA Vin = 2.0 V
R
RST
Pull-Down Resistor 50 90 200 kΩ
C
IO
Pin Capacitance 10 pF T
A
= 25°C
V
RET
V
DD
Data Retention Limit 1.8 V