Datasheet
Table Of Contents
- Description
- Features
- Device Structure
- USE RESTRICTION NOTICE
- 1. Block Diagram and Pin Configuration
- 2. Pixel Signal Output Specifications
- 3. Control Registers
- 3-1 2-wire Serial Communication Operation Specifications
- 3-2 2-wire Serial Communication Register Map (Configuration register, Parameter limit register)
- 3-3 Parameter Limit Registers – [0x1000-0x1FFF] (Read Only and Static)
- 3-4 Manufacturer Specific Registers – [0x3000-0x5FFF ]
- 3-5 Frame Bank A and Bank B specific output samples
- 4. Output Data Format
- 6. On Chip Image Processing
- 7. NVM Memory Map
- 8. How to operate IMX219PQH5-C
- 9. Other Functions
- 10. Electrical Characteristics
- 11. Spectral Sensitivity Characteristic
- 12. Image Sensor Characteristics
- 13. Measurement Method for Image Sensor Characteristics
- 14. Spot Pixel Specification
- 15. Notice on White Pixels Specifications
- 16. Chief Ray Angle Characteristics
- 17. Connection Example
- 18. Notes On Handling
IMX219PQH5-C
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6. On Chip Image Processing
-
A/D-converted digital signal is input, and processed data is asserted from CSI-2.
Fig. 32 Data Flow Diagram
6-1 Test Pattern Generator
The IMX219PQH5-C can output test signals using the internal pattern generator.
6-1-1 Test Pattern
The test pattern output function outputs fixed pattern image data from the IMX219PQH5-C. Built-in image patterns
can be output by setting the necessary registers.
The registers must be set by communication to output the test pattern. There are no restrictions on the sequence
for setting the registers related to test pattern output. The prescribed output is obtained by setting the necessary
registers while the sensor is operating.
Analogue
Domain
Test
Pattern
Generator
Digital Gain
Setting
Black
Level
Adjust
Defect
Correction
Pixel
Re-align
In H
direction
FIFO
default mode