Datasheet

SW06
REV. A
–4–
WAFER TEST LIMITS
SW06N SW06G
Parameter Symbol Conditions Limit Limit Units
“ON” RESISTANCE R
ON
–10 V ≤ V
A
≤ 10 V, I
S
≤ 1 mA 80 100 Ω max
R
ON
MATCH BETWEEN SWITCHES R
ON
Match V
A
= 0 V, I
S
≤ 100 µA 15 20 % max
∆R
ON
VS. V
A
∆R
ON
–10 V ≤ V
A
≤ 10 V, I
S
≤ 1 mA 10 20 % max
POSITIVE SUPPLY CURRENT I+ Note 1 6.0 9.0 mA max
NEGATIVE SUPPLY CURRENT I– Note 1 5.0 7.0 mA max
GROUND CURRENT I
G
Note 1 4.0 4.0 mA max
ANALOG VOLTAGE RANGE V
A
I
S
= 1 mA ±10.0 ±10.0 V min
LOGIC “1” INPUT VOLTAGE V
INH
Note 2 2.0 2.0 V min
LOGIC “0” INPUT VOLTAGE V
INL
Note 2 0.8 0.8 V max
LOGIC “0” INPUT CURRENT I
INL
0 V ≤ V
IN
≤ 0.8 V 5.0 5.0 µA max
LOGIC “1” INPUT CURRENT I
INH
2.0 V ≤ V
IN
≤ 15 V
3
55µA max
ANALOG CURRENT RANGE I
A
V
S
= ±10 mV 10 7 mA min
NOTE
Electrical tests are performed at wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed
for standard product dice. Consult factory to negotiate specifications based on dice lot qualification through sample lot assembly and testing.
TYPICAL ELECTRICAL CHARACTERISTICS
SW06N SW06G
Parameter Symbol Conditions Typical Typical Units
“ON” RESISTANCE R
ON
–10 V ≤ V
A
≤ 10 V, I
S
≤ 1 mA 60 60 Ω
TURN-ON TIME t
ON
340 340 ns
TURN-OFF TIME t
OFF
200 200 ns
DRAIN CURRENT IN
“OFF” CONDITION I
D(OFF)
V
S
= 10 V, V
D
= –10 V 0.3 0.3 nA
“OFF” ISOLATION I
SO(OFF)
f = 500 kHz, R
L
= 680 Ω 58 58 dB
CROSSTALK C
T
f = 500 kHz, R
L
= 680 Ω 70 70 dB
NOTES
1
Power supply and ground current specified for switch “ON” or “OFF.”
2
Guaranteed by R
ON
and leakage tests.
3
Current tested at V
IN
= 2.0 V. This is worst case condition.
(@ V+ = +15 V, V– = –15 V, T
A
= +258C, unless otherwise noted)
(@ V+ = +15 V, V– = –15 V, T
A
= +258C, unless otherwise noted)