Datasheet

MAT01 Data Sheet
TEST CIRCUITS
Figure 11. Matching Measurement Circuit
Figure 12. Noise Measurement Circuit
+16.5V
50kΩ*
50kΩ*
TEST UNITS
20kΩ
OP1177
100kΩ
1%
1MΩ 1MΩ*
100kΩ
1%
–15V
V
OUT
S1
B
S1
A
S1
A
S1
B
V
OS
V
OUT1
CLOSED CLOSED
I
OS
V
OUT2
– V
OUT1
1V PER mV
1V PER nAOPEN OPEN
100pF
MAT01
100pF
50kΩ*
V–
20µA
*MATCHED TO 0.01%
+16.5V
00282-011
+15V
50kΩ*
50kΩ*
TEST
V
01
/√2
2.5MΩ
4kΩ
V
02
3.3kΩ
LOW
FREQUENCY
NOISE
NOISE
DENSITY
4MΩ 4MΩ
100Ω
4.7µF
–15V
+15V
S1
B
S2
S3
B
A
S1
A
S1
A
S1
B
V
01
/(√2 × 4MΩ)
OPEN OPEN CLOSED
A
NOISE VOLTAGE DENSITY
(PER TRANSISTOR)
NOISE CURRENT DENSITY
(PER TRANSISTOR)
LOW FREQUENCY NOISE
(REFERRED TO INPUT)
CLOSED CLOSED CLOSED A
OPEN B
V
02
PEAK-TO-PEAK
25,000
CLOSED CLOSED
2pF
MAT01
2pF
50kΩ*
–15V
20µA720kΩ
*MATCHED TO 0.01%
S2 S3**
READING
00282-012
V
01
SPECTRUM
ANALYZER
OR
QUAN-TECH
IC NOISE
ANALYZER
2181/2283
**A AND B REFER TO THE THROW POSITION OF THE SWITCH
Rev. D | Page 8 of 12