Datasheet

Data Sheet ADuCM360/ADuCM361
Rev. B | Page 9 of 24
Parameter Test Conditions/Comments Min Typ Max Unit
Logic Outputs
Output High Voltage, V
OH
I
SOURCE
= 1 mA IOVDD − 0.4 V
Output Low Voltage, V
OL
I
SINK
= 1 mA 0.4 V
CRYSTAL OSCILLATOR
1
32.768 kHz crystal inputs
Logic Inputs, XTALI Only
14
Input Low Voltage, V
INL
0.8 V
Input High Voltage, V
INH
1.7 V
XTALI Capacitance
6
pF
XTALO Capacitance 6 pF
ON-CHIP LOW POWER OSCILLATOR
Oscillator Frequency
32.768
kHz
Accuracy −30 ±10 +30 %
ON-CHIP HIGH FREQUENCY OSCILLATOR
Oscillator Frequency 16 MHz
Accuracy −40°C to +125°C −1.8 +1.4 %
Long Term Stability
5
0.8 °C/1000Hr
PROCESSOR CLOCK RATE
1
Nine programmable core clock
selections within specified range
0.0625 0.5 16 MHz
Using an External Clock 0.032768 16 MHz
PROCESSOR START-UP TIME
1
At Power-On
Includes kernel power-on execution
time
41 ms
After Reset Event
Includes kernel power-on execution
time
1.44 ms
From Processor Power-Down
(Mode 1, Mode 2, and Mode 3)
f
CLK
is the Cortex-M3 core clock
3 to 5
f
CLK
From Total Halt or Hibernate Mode
(Mode 4 or Mode 5)
30.8 μs
POWER REQUIREMENTS
Power Supply Voltages, V
DD
AVDD, IOVDD 1.8 3.6 V
Power Consumption
I
DD
(MCU Active Mode)
15, 16
Processor clock rate = 16 MHz;
all peripherals on (CLKSYSDIV = 0)
5.5 mA
Processor clock rate = 8 MHz;
all peripherals on (CLKSYSDIV = 1)
3 mA
Processor clock rate = 500 kHz; both
ADCs on (input buffers off) with PGA
gain = 4, 1 × SPI port on, all timers on
1 mA
I
DD
(MCU Powered Down)
Full temperature range, total halt mode
(Mode 4)
4
μA
Reduced temperature range, −40°C
to +85°C
4 μA
I
DD
, Total (ADC0)
16
PGA enabled, gain ≥ 32 320 μA
PGA Gain = 4, 8, or 16, PGA only 130 μA
Gain = 32, 64, or 128, PGA only 180 μA
Input Buffers 2 × input buffers = 70 μA 70 μA
Digital Interface and Modulator 70 μA
I
DD
(ADC1) Input buffers off, gain = 4, 8, or 16 only 200 μA
External Reference Input Buffers 60 μA each 120 μA
1
These numbers are not production tested, but are guaranteed by design and/or characterization data at production release.
2
Tested at gain = 4 after initial offset calibration.
3
Measured with an internal short. A system zero-scale calibration removes this error.
4
A recalibration at any temperature removes these errors.
5
The long term stability specification is noncumulative. The drift in subsequent 1000 hour periods is significantly lower than in the first 1000 hour period.
6
These numbers do not include internal reference temperature drift.
7
Factory calibrated at gain = 1.