Datasheet

REV. 0–4–
ADuC831
Parameter V
DD
= 5 V V
DD
= 3 V Unit Test Conditions/Comments
DAC CHANNEL SPECIFICATIONS
12, 13
Internal Buffer Disabled
DC ACCURACY
10
Resolution 12 12 Bits
Relative Accuracy ± 3 ± 3LSB typ
Differential Nonlinearity
11
–1 –1 LSB max Guaranteed 12-bit Monotonic
± 1/2 ± 1/2 LSB typ
Offset Error ± 5 ± 5 mV max V
REF
Range
Gain Error –0.3 –0.3 % typ V
REF
Range
Gain Error Mismatch
4
0.5 0.5 % max % of Full-Scale on DAC1
ANALOG OUTPUTS
Voltage Range_0 0 to V
REF
0 to V
REF
V typ DAC V
REF
= 2.5 V
REFERENCE INPUT/OUTPUT
REFERENCE OUTPUT
14
Output Voltage (V
REF
) 2.5 2.5 V
Accuracy ± 2.5 ± 2.5 % max Of V
REF
Measured at the C
REF
Pin
Power Supply Rejection 47 57 dB typ
Reference Temperature Coefficient ± 100 ± 100 ppm/∞C typ
Internal V
REF
Power-On Time 80 80 ms typ
EXTERNAL REFERENCE INPUT
15
Voltage Range (V
REF
)
4
0.1 0.1 V min V
REF
and C
REF
Pins Shorted
V
DD
V
DD
V max
Input Impedance 20 20 kW typ
Input Leakage 1 1 mA max Internal Band Gap Deselected via
ADCCON1.6
POWER SUPPLY MONITOR (PSM)
DV
DD
Trip Point Selection Range 2.63 V min Four Trip Points Selectable in
4.37 V max This Range Programmed via
TPD1–0 in PSMCON
DV
DD
Power Supply Trip Point Accuracy ± 3.5 % max
WATCHDOG TIMER (WDT)
4
Time-out Period 0 0 ms min Nine Time-out Periods
2000 2000 ms max Selectable in This Range
FLASH/EE MEMORY RELIABILITY
CHARACTERISTICS
16
Endurance
17
100,000 100,000 Cycles min
Data Retention
18
100 100 Years min
DIGITAL INPUTS
Input High Voltage (V
INH
)
4
2.4 2 V min
Input Low Voltage (V
INL
)
4
0.8 0.4 V max
Input Leakage Current (Port 0, EA) ± 10 ± 10 mA max V
IN
= 0 V or V
DD
± 1 ± 1 mA typ V
IN
= 0 V or V
DD
Logic 1 Input Current
(All Digital Inputs) ± 10 ± 10 mA max V
IN
= V
DD
± 1 ± 1 mA typ V
IN
= V
DD
Logic 0 Input Current (Port 1, 2, 3) –75 –25 mA max
–40 –15 mA typ V
IL
= 450 mV
Logic 1-0 Transition Current (Port 2, 3) –660 –250 mA max V
IL
= 2 V
–400 –140 mA typ V
IL
= 2 V
SPECIFICATIONS (continued)