Datasheet
REV. 0
–7–
ADuC816
Parameter ADuC816BS Unit Test Conditions/Comments
POWER REQUIREMENTS (continued)
Power Supply Currents Normal Mode
16, 17
DV
DD
Current 4 mA max DV
DD
= 4.75 V to 5.25 V, Core CLK = 1.57 MHz
2.1 mA max DV
DD
= 2.7 V to 3.6 V, Core CLK = 1.57 MHz
AV
DD
Current 170 μA max AV
DD
= 5.25 V, Core CLK = 1.57 MHz
DV
DD
Current 15 mA max DV
DD
= 4.75 V to 5.25 V, Core CLK = 12.58 MHz
8 mA max DV
DD
= 2.7 V to 3.6 V, Core CLK = 12.58 MHz
AV
DD
Current 170 μA max AV
DD
= 5.25 V, Core CLK = 12.58 MHz
Power Supply Currents Idle Mode
16, 17
DV
DD
Current 1.2 mA max DV
DD
= 4.75 V to 5.25 V, Core CLK = 1.57 MHz
750 μA typ DV
DD
= 2.7 V to 3.6 V, Core CLK = 1.57 MHz
AV
DD
Current 140 μA typ Measured @ AV
DD
= 5.25 V, Core CLK = 1.57 MHz
DV
DD
Current 2 mA typ DV
DD
= 4.75 V to 5.25 V, Core CLK = 12.58 MHz
1 mA typ DV
DD
= 2.7 V to 3.6 V, Core CLK = 12.58 MHz
AV
DD
Current 140 μA typ Measured at AV
DD
= 5.25 V, Core CLK = 12.58 MHz
Power Supply Currents Power-Down Mode
16, 17
Core CLK = 1.57 MHz or 12.58 MHz
DV
DD
Current 50 μA max DV
DD
= 4.75 V to 5.25 V, Osc. On, TIC On
20 μA max DV
DD
= 2.7 V to 3.6 V, Osc. On, TIC On
AV
DD
Current 1 μA max Measured at AV
DD
= 5.25 V, Osc. On or Osc. Off
DV
DD
Current 20 μA max DV
DD
= 4.75 V to 5.25 V, Osc. Off
5 μA typ DV
DD
= 2.7 V to 3.6 V, Osc. Off
Typical Additional Power Supply Currents Core CLK = 1.57 MHz, AV
DD
= DV
DD
= 5 V
(AI
DD
and DI
DD
)
PSM Peripheral 50 μA typ
Primary ADC 1 mA typ
Auxiliary ADC 500 μA typ
DAC 150 μA typ
Dual Current Sources 400 μA typ
NOTES
1
Temperature Range –40°C to +85°C.
2
These numbers are not production tested but are guaranteed by Design and/or Characterization data on production release.
3
The primary ADC is factory-calibrated at 25°C with AV
DD
= DV
DD
= 5 V yielding this full-scale error. If user power supply or temperature conditions are signifi-
cantly different from these, an Internal Full-Scale Calibration will restore this error to this level.
4
Gain Error Drift is a span drift. To calculate Full-Scale Error Drift, add the Offset Error Drift to the Gain Error Drift times the full-scale input.
5
The auxiliary ADC is factory-calibrated at 25°C with AV
DD
= DV
DD
= 5 V yielding this full-scale error of –2.5 LSB. A system zero-scale and full-scale calibration
will remove this error altogether.
6
DAC linearity and AC Specifications are calculated using:
reduced code range of 48 to 4095, 0 to V
REF
reduced code range of 48 to 3995, 0 to V
DD
.
7
Gain Error is a measure of the span error of the DAC.
8
In general terms, the bipolar input voltage range to the primary ADC is given by Range
ADC
= ± (V
REF
2
RN
)/125, where:
V
REF
= REFIN(+) to REFIN(–) voltage and V
REF
= 1.25 V when internal ADC V
REF
is selected.
RN = decimal equivalent of RN2, RN1, RN0, e.g., V
REF
= 2.5 V and RN2, RN1, RN0 = 1, 1, 0 the Range
ADC
= ± 1.28 V.
In unipolar mode the effective range is 0 V to 1.28 V in our example.
9
1.25 V is used as the reference voltage to the ADC when internal V
REF
is selected via XREF0 and XREF1 bits in ADC0CON and ADC1CON respectively.
10
In bipolar mode, the Auxiliary ADC can only be driven to a minimum of A
GND
– 30 mV as indicated by the Auxiliary ADC absolute AIN voltage limits. The bipolar
range is still –V
REF
to +V
REF
; however, the negative voltage is limited to –30 mV.
11
Pins configured in I
2
C-compatible mode or SPI mode, pins configured as digital inputs during this test.
12
Pins configured in I
2
C-compatible mode only.
13
Flash/EE Memory Reliability Characteristics apply to both the Flash/EE program memory and Flash/EE data memory.
14
Endurance is qualified to 100 Kcycles as per JEDEC Std. 22 method A117 and measured at –40 °C, +25°C and +85°C, typical endurance at 25°C is 700 Kcycles.
15
Retention lifetime equivalent at junction temperature (T
J
) = 55°C as per JEDEC Std. 22, Method A117. Retention lifetime based on an activation energy of 0.6eV
will derate with junction temperature as shown in Figure 27 in the Flash/EE Memory description section of this data sheet.
16
Power Supply current consumption is measured in Normal, Idle, and Power-Down Modes under the following conditions:
Normal Mode: Reset = 0.4 V, Digital I/O pins = open circuit, Core Clk changed via CD bits in PLLCON, Core Executing internal software loop.
Idle Mode: Reset = 0.4 V, Digital I/O pins = open circuit, Core Clk changed via CD bits in PLLCON, PCON.0 = 1, Core Execution suspended in idle mode.
Power-Down Mode: Reset = 0.4 V, All P0 pins and P1.2–P1.7 pins = 0.4 V, All other digital I/O pins are open circuit, Core Clk changed via CD bits in PLLCON,
PCON.1 = 1, Core Execution suspended in power-down mode, OSC turned ON or OFF via OSC_PD bit (PLLCON.7) in PLLCON SFR.
17
DV
DD
power supply current will typically increase by 3 mA (3 V operation) and 10 mA (5 V operation) during a Flash/EE memory program or erase cycle.
Specifications subject to change without notice
REV. A