Datasheet

ADuC7033
Rev. B | Page 6 of 140
Parameter Test Conditions/Comments Min Typ Max Unit
ADC Low Power Reference
Internal V
REF
1.2 V
Initial Accuracy Measured at T
A
= 25°C −5 +5 %
Initial Accuracy
1
Using ADCREF, measured at T
A
= 25°C 0.1 %
Temperature Coefficient
1, 22
−300 ±150 +300 ppm/°C
RESISTIVE ATTENUATOR
Divider Ratio 24
Resistor Mismatch Drift 3 ppm/°C
ADC GROUND SWITCH
Resistance Direct path to ground 10 Ω
20 kΩ resistor selected 10 20 30 kΩ
Input Current 6 mA
TEMPERATURE SENSOR
25
After user calibration
Accuracy MCU in power-down or standby mode ±3 °C
MCU in power-down or standby mode,
temperature range = −25°C to +65°C
±2 °C
POWER-ON RESET (POR)
POR Trip Level Refers to voltage at VDD pin 2.85 3.0 3.15 V
POR Hysteresis 300 mV
RESET Timeout from POR 20 ms
LOW VOLTAGE FLAG (LVF)
LVF Level Refers to voltage at VDD pin 1.9 2.1 2.3 V
POWER SUPPLY MONITOR (PSM)
PSM Trip Level Refers to voltage at VDD pin 6.0 V
WATCHDOG TIMER (WDT)
Timeout Period
1
32.768 kHz clock, 256 prescale 0.008 512 sec
Timeout Step Size 7.8 ms
FLASH/EE MEMORY
1
Endurance
26
10,000 Cycles
Data Retention
27
20 Years
DIGITAL INPUTS All digital inputs except NTRST
Input Leakage Current Input (high) = REG_DVDD −10 ±1 +10 μA
Input Pull-up Current Input (low) = 0 V −80 −20 −10 μA
Input Capacitance 10 pF
Input Leakage Current NTRST only: input (low) = 0 V −10 ±1 +10 μA
Input Pull-Down Current NTRST only: input (high) = REG_DVDD 30 55 100 μA
LOGIC INPUTS
1
All logic inputs
V
INL
, Input Low Voltage 0.4 V
V
INH
, Input High Voltage 2.0 V
CRYSTAL OSCILLATOR
1
Logic Inputs, XTAL1 Only
V
INL
, Input Low Voltage 0.8 V
V
INH
, Input High Voltage 1.7 V
XTAL1 Capacitance 12 pF
XTAL2 Capacitance 12 pF
ON-CHIP OSCILLATORS
Low Power Oscillator 131.072 kHz
Accuracy
28
Includes drift data from 1000-hour life test −3 +3 %
Precision Oscillator 131.072 kHz
Accuracy Includes drift data from 1000-hour life test −1 +1 %
MCU CLOCK RATE
8 programmable core clock selections within this
range (binary divisions 1, 2, 4, 8 . . . 64, 128)
0.160 10.24 20.48 MHz