Datasheet

Rev. B | Page 20 of 44 | July 2013
ADSP-BF592
ABSOLUTE MAXIMUM RATINGS
Stresses greater than those listed in Table 14 may cause perma-
nent damage to the device. These are stress ratings only.
Functional operation of the device at these or any other condi-
tions greater than those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device
reliability.
Table 14 specifies the maximum total source/sink (I
OH
/I
OL
) cur-
rent for a group of pins and for individual pins. Permanent
damage can occur if this value is exceeded. To understand this
specification, if pins PF0 and PF1 from Group 1 in Table 16
were sourcing or sinking 10 mA each, the total current for those
pins would be 20 mA. This would allow up to 35 mA total that
could be sourced or sunk by the remaining pins in the group
without damaging the device. It should also be noted that the
maximum source or sink current for an individual pin cannot
exceed 25 mA. The list of all groups and their pins are shown in
Table 16. Note that the V
OH
and V
OL
specifications have separate
per-pin maximum current requirements, see the Electrical
Characteristics table.
ESD SENSITIVITY
Table 14. Absolute Maximum Ratings
Parameter Rating
Internal Supply Voltage (V
DDINT
) –0.3 V to +1.50 V
External (I/O) Supply Voltage (V
DDEXT
)–0.3 V to +3.8 V
Input Voltage
1, 2
1
Applies to 100% transient duty cycle. For other duty cycles see Table 15.
2
Applies only when V
DDEXT
is within specifications. When V
DDEXT
is outside speci-
fications, the range is V
DDEXT
± 0.2 Volts.
–0.5 V to +3.6 V
Output Voltage Swing –0.5 V to V
DDEXT
+0.5 V
I
OH
/I
OL
Current per Pin Group 55 mA (Max)
I
OH
/I
OL
Current per Individual Pin 25 mA (Max)
Storage Temperature Range –65°C to +150°C
Junction Temperature While Biased
(Non-Automotive Models)
+110°C
Junction Temperature While Biased
(Automotive Models)
+115°C
Table 15. Maximum Duty Cycle for Input Transient Voltage
1
1
Applies to all signal pins with the exception of CLKIN, XTAL, EXT_WAKE.
V
IN
Min (V)
2
2
The individual values cannot be combined for analysis of a single instance of
overshoot or undershoot. The worst case observed value must fall within one of
the voltages specified, and the total duration of the overshoot or undershoot
(exceeding the 100% case) must be less than or equal to the corresponding duty
cycle.
V
IN
Max (V)
2
Maximum Duty Cycle
3
3
Duty cycle refers to the percentage of time the signal exceeds the value for the
100% case. The is equivalent to the measured duration of a single instance of
overshoot or undershoot as a percentage of the period of occurrence.
–0.5 +3.8 100%
–0.7 +4.0 40%
–0.8 +4.1 25%
–0.9 +4.2 15%
–1.0 +4.3 10%
Table 16. Total Current Pin Groups–V
DDEXT
Groups
Group Pins in Group
1 PF0, PF1, PF2, PF3
2 PF4, PF5, PF6, PF7
3 PF8, PF9, PF10, PF11
4 PF12, PF13, PF14, PF15
5 PG3, PG2, PG1, PG0
6 PG7, PG6, PG5, PG4
7 PG11, PG10, PG9, PG8
8 PG15, PG14, PG13, PG12
9 TDI, TDO, EMU, TCK, TRST
, TMS
10 BMODE2, BMODE1, BMODE0
11 EXT_WAKE, PG
, RESET, NMI, PPI_CLK, EXTCLK
12 SDA, SCL, CLKIN, XTAL
ESD (electrostatic discharge) sensitive device.
Charged devices and circuit boards can discharge
without detection. Although this product features
patented or proprietary circuitry, damage may occur
on devices subjected to high energy ESD. Therefore,
proper ESD precautions should be taken to avoid
performance degradation or loss of functionality.