Datasheet

Data Sheet ADP7104
Rev. F | Page 5 of 28
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Rating
VIN to GND −0.3 V to +22 V
VOUT to GND −0.3 V to +20 V
EN/UVLO to GND −0.3 V to VIN
PG to GND −0.3 V to VIN
SENSE/ADJ to GND −0.3 V to VOUT
Storage Temperature Range −65°C to +150°C
Operating Junction Temperature Range −40°C to +125°C
Soldering Conditions
JEDEC J-STD-020
Stresses above those listed under absolute maximum ratings
may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or
any other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL DATA
Absolute maximum ratings apply individually only, not in
combination. The ADP7104 can be damaged when the junction
temperature limit is exceeded. Monitoring ambient temperature
does not guarantee that T
J
is within the specified temperature
limits. In applications with high power dissipation and poor
thermal resistance, the maximum ambient temperature may
have to be derated.
In applications with moderate power dissipation and low PCB
thermal resistance, the maximum ambient temperature can
exceed the maximum limit as long as the junction temperature
is within specification limits. The junction temperature (T
J
) of
the device is dependent on the ambient temperature (T
A
), the
power dissipation of the device (P
D
), and the junction-to-ambient
thermal resistance of the package (θ
JA
).
Maximum junction temperature (T
J
) is calculated from the
ambient temperature (T
A
) and power dissipation (P
D
) using the
formula
T
J
= T
A
+ (P
D
× θ
JA
)
Junction-to-ambient thermal resistance (θ
JA
) of the package is
based on modeling and calculation using a 4-layer board. The
junction-to-ambient thermal resistance is highly dependent on
the application and board layout. In applications where high
maximum power dissipation exists, close attention to thermal
board design is required. The value of θ
JA
may vary, depending
on PCB material, layout, and environmental conditions. The
specified values of θ
JA
are based on a 4-layer, 4 in. × 3 in. circuit
board. See JESD51-7 and JESD51-9 for detailed information on
the board construction. For additional information, see the
AN-617 Application Note, MicroCSP™ Wafer Level Chip Scale
Package, available at www.analog.com.
Ψ
JB
is the junction-to-board thermal characterization parameter
with units of °C/W. The package’s Ψ
JB
is based on modeling and
calculation using a 4-layer board. The JESD51-12, Guidelines for
Reporting and Using Electronic Package Thermal Information,
states that thermal characterization parameters are not the same
as thermal resistances. Ψ
JB
measures the component power
flowing through multiple thermal paths rather than a single
path as in thermal resistance, θ
JB
. Therefore, Ψ
JB
thermal paths
include convection from the top of the package as well as
radiation from the package, factors that make Ψ
JB
more useful
in real-world applications. Maximum junction temperature (T
J
)
is calculated from the board temperature (T
B
) and power
dissipation (P
D
) using the formula
T
J
= T
B
+ (P
D
× Ψ
JB
)
See JESD51-8 and JESD51-12 for more detailed information
about Ψ
JB
.
THERMAL RESISTANCE
θ
JA
and Ψ
JB
are specified for the worst-case conditions, that is, a
device soldered in a circuit board for surface-mount packages
. θ
JC
is a parameter for surface-mount packages with top mounted
heatsinks.
θ
JC
is presented here for reference only.
Table 4. Thermal Resistance
Package Type
θ
JA
θ
JC
Ψ
JB
Unit
8-Lead LFCSP 40.1 27.1 17.2 °C/W
8-Lead SOIC 48.5 58.4 31.3 °C/W
ESD CAUTION