Datasheet

ADP1046A Data Sheet
Rev. 0 | Page 8 of 88
Parameter Symbol Test Conditions/Comments Min Typ Max Unit
EEPROM RELIABILITY
Endurance
1
T
J
= 85°C 10,000 Cycles
T
J
= 125°C 1000 Cycles
Data Retention
2
T
J
= 85°C 20 Years
T
J
= 125°C
10
Years
1
Endurance is qualified as per JEDEC Standard 22, Method A117, and is measured at −40°C, +25°C, +85°C, and +125°C. Endurance conditions are subject to change
pending EEPROM qualification.
2
Retention lifetime equivalent at junction temperature (T
J
) = 85°C as per JEDEC Standard 22, Method A117. The derated retention lifetime equivalent at junction
temperature T
J
= 125°C is 2.87 years and is subject to change pending EEPROM qualification.
Timing Diagram
SCL
SDA
P S
t
BUF
t
HD;STA
t
HD;DAT
t
HIGH
t
SU;DAT
t
HD;STA
t
SU;STA
t
SU;STO
t
LOW
t
R
t
F
S P
11012-103
Figure 2. Serial Bus Timing Diagram