Datasheet

ADN2873
Rev. 0 | Page 4 of 20
Parameter Min Typ Max Unit Conditions/Comments
IBMON, IMMON DIVISION RATIO
IBIAS/IBMON
3
76 98 112 A/A 2 mA < IBIAS < 11 mA
IBIAS/IBMON
3
85 98 115 A/A 11 mA < IBIAS < 50 mA
IBIAS/IBMON
3
92 100 108 A/A 50 mA < IBIAS < 100 mA
IBIAS/IBMON STABILITY
3, 10
±5 % 10 mA < IBIAS < 100 mA
IMOD/IMMON 42 A/A
IBMON Compliance Voltage 0 1.3 V
SUPPLY
I
CC
11
31 mA When IBIAS = IMOD = 0 mA
V
CC
(with Respect to GND)
12
3.0 3.3 3.6 V
1
Temperature range is from −40°C to +85°C.
2
Measured into a single-ended 15 Ω load (22 Ω resistor in parallel with digital scope 50 Ω input) using a 1111111100000000 pattern at 2.5 Gbps, shown in Figure 2.
3
Guaranteed by design and characterization. Not production tested.
4
Measured into a single-ended 15 Ω load using a K28.5 pattern at 2.5 Gbps, shown in Figure 2.
5
Measured into a differential 30 Ω (43 Ω differential resistor in parallel with a digital scope of 50 Ω input) load using a 1111111100000000 pattern at 4.25 Gbps, as
shown in Figure 3.
6
Measured into a differential 30 Ω load using a K28.5 pattern at 4.25 Gbps, as shown in Figure 3.
7
Measured into a differential 30 Ω load using a K28.5 pattern at 2.7 Gbps, as shown in Figure 3.
8
When the voltage on DATAP is greater than the voltage on DATAN, the modulation current flows into the IMODP pin.
9
Guaranteed by design. Not production tested.
10
IBIAS/IBMON ratio stability is defined in SFF-8472 Revision 9 over temperature and supply variation.
11
See the I
CC
minimum for power calculation in the Power Consumption section.
12
All VCC pins should be shorted together.
ADN2873
IMODP
BIAS TEE
80kHz → 27GHz
V
CC
V
CC
TO HIGH SPEED
DIGITAL
OSCILLOSCOPE
50Ω INPUT
R
22Ω
C
L
07493-002
Figure 2. High Speed Electrical Test Single-Ended Output Circuit
ADN2873
IMODN
BIAS TEE
80kHz → 27GHz
V
CC
TO HIGH SPEED
DIGITAL
OSCILLOSCOPE
50Ω DIFFERENTIAL INPUT
R
43Ω
C
L
V
CC
IMODP
L
C
BIAS TEE
80kHz → 27GHz
07493-003
Figure 3. High Speed Electrical Test Differential Output Circuit