Datasheet

ADM3252E Data Sheet
Rev. A | Page 4 of 16
Parameter Min Typ Max Unit Test Conditions/Comments
AC SPECIFICATIONS
Output Rise/Fall Time, t
R
/t
F
(10% to 90%)
2.5
ns
C
L
= 15 pF, CMOS signal levels
Common-Mode Transient Immunity
Logic High Output
2
25
kV/μs
V
CM
= 1 kV, transient magnitude = 800 V
Logic Low Output
2
25
kV/μs
V
CM
= 1 kV, transient magnitude = 800 V
Refresh Rate 1.0 Mbps
1
Guaranteed by design.
2
V
CM
is the maximum common-mode voltage slew rate that can be sustained while maintaining specification compliant operation. V
CM
is the common-mode potential
difference between the logic and bus sides. The transient magnitude is the range over which the common-mode voltage is slewed. The common-mode voltage slew
rates apply to both rising and falling common-mode edges.
PACKAGE CHARACTERISTICS
Table 2.
Parameter Symbol Min Typ Max Unit Test Conditions/Comments
PACKAGE CHARACTERISTICS
Resistance (Input-to-Output) R
I-O
10
12
Ω
Capacitance (Input-to-Output) C
I-O
2.2 pF f = 1 MHz
Input Capacitance C
I
4.0 pF
IC Junction-to-Air Thermal Resistance θ
JA
40 °C/W
REGULATORY INFORMATION (PENDING)
Table 3.
UL CSA VDE
Recognized Under UL 1577
Component Recognition
Program
1
Approved under CSA Component Acceptance
Notice #5A
Certified according to IEC 60747-5-2 (VDE 0884
Part 2):2003-01
2
Single Protection, 2500 V rms
Isolation Voltage
Testing was conducted per CSA 60950-1-07 and
IEC 60950-1 2
nd
ed. at 2.5 kV rated voltage
Basic insulation, 560 V peak
Basic insulation at 400 V rms (565 V peak)
working voltage
1
In accordance with UL 1577, each ADM3252E is proof tested by applying an insulation test voltage ≥ 3000 V rms for 1 second (current leakage detection limit = 15 µA).
2
In accordance with IEC 60747-5-2 (VDE 0884 Part 2):2003-01, each ADM3252E is proof tested by applying an insulation test voltage ≥ 1050 V peak for 1 second (partial
discharge detection limit = 5 pC). The asterisk (*) marking branded on the component designates IEC 60747-5-2 (VDE 0884 Part 2):2003-01 approval.