Datasheet

ADM2486 Data Sheet
Rev. E | Page 10 of 20
TEST CIRCUITS
0
4604-005
V
OC
R
R
V
OD
Figure 3. Driver Voltage Measurement
04604-006
60Ω
V
OD3
375
Ω
375Ω
V
TEST
Figure 4. Driver Voltage Measurement
V
DD1
DE
150Ω
GND
1
A
B
V
DD2
GND
2
GALVANIC ISOLATION
04604-004
V
DD2
195Ω
110Ω
195Ω
GND
2
RTS
TxD
RxD
RE
Figure 5. Supply-Current Measurement Test Circuit
V
DD1
DE
GND
1
A
B
V
DD2
GND
2
GALVANIC ISOLATION
04604-010
50Ω
110nF
50Ω
V
TEST2
RTS
TxD
RxD
GND
2
2.2kΩ
100nF
100nF
V
CM(HF)
470nF
22kΩ
F
TEST
,
V
HF
RECEIVE
ENABLE
195Ω
110Ω
195Ω
V
DD2
GND
2
Figure 6. High Frequency Common-Mode Noise Test Circuit
04604-007
C
L2
C
L1
R
LDIFF
A
B
Figure 7. Driver Propagation Delay
V
DD1
DE
GND
1
A
B
V
DD2
GND
2
GALVANIC ISOLATION
04604-008
RTS
TxD
RxD
RE
150Ω
50pF
Figure 8. RTS-to-DE Propagation Delay
04604-009
V
CC
S2
V
OUT
110Ω
50pF
S1
B
A
TxD
RTS
Figure 9. Driver Enable/Disable
0
4604-012
C
L
V
OUT
RE
A
B
Figure 10. Receiver Propagation Delay
04604-013
V
CC
S2
V
OUT
R
L
C
L
+1.5
V
–1.5V
S1
RE
RE IN
Figure 11. Receiver Enable/Disable