Datasheet

ADG836
Rev. A | Page 3 of 16
SPECIFICATIONS
V
DD
= 2.7 V to 3.6 V, GND = 0 V, unless otherwise noted.
Table 1.
Temperature
1
Parameter +25°C −40°C to +85°C −40°C to +125°C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V
DD
V
On Resistance (R
ON
) 0.5 Ω typ V
DD
= 2.7 V, V
S
= 0 V to V
DD
, I
S
= 100 mA;
0.65 0.75 0.8 Ω max Figure 19
On Resistance Match 0.04 Ω typ V
DD
= 2.7 V, V
S
= 0.65 V, I
S
= 100 mA
Between Channels (∆R
ON
) 0.075 0.08 Ω max
On Resistance Flatness (R
FLAT (ON)
) 0.1 Ω typ V
DD
= 2.7 V, V
S
= 0 V to V
DD
0.15 0.16 Ω max I
S
= 100 mA
LEAKAGE CURRENTS V
DD
= 3.6 V
Source Off Leakage I
S
(OFF) ±0.2 nA typ
V
S
= 0.6 V/3.3 V, V
D
= 3.3 V/0.6 V;
Figure 20
Channel On Leakage I
D
, I
S
(ON) ±0.2 nA typ V
S
= V
D
= 0.6 V or 3.3 V; Figure 21
DIGITAL INPUTS
Input High Voltage, V
INH
2 V min
Input Low Voltage, V
INL
0.8 V max
Input Current
I
INL
or I
INH
0.005 µA typ V
IN
= V
INL
or V
INH
±0.1 µA max
C
IN
, Digital Input Capacitance 4 pF typ
DYNAMIC CHARACTERISTICS
2
t
ON
21 ns typ R
L
= 50 Ω, C
L
= 35 pF
26 28 29 ns max V
S
= 1.5 V/0 V; Figure 22
t
OFF
4 ns typ R
L
= 50 Ω, C
L
= 35 pF
7 8 9 ns max V
S
= 1.5 V; Figure 22
Break-Before-Make Time Delay 17 ns typ R
L
= 50 Ω, C
L
= 35 pF
(t
BBM
) 5 ns min V
S1
= V
S2
= 1.5 V; Figure 23
Charge Injection 40 pC typ V
S
= 1.5 V, R
S
= 0 Ω, C
L
= 1 nF; Figure 24
Off Isolation −67 dB typ
R
L
= 50 Ω, C
L
= 5 pF, f = 100 kHz;
Figure 25
Channel-to-Channel Crosstalk −90 dB typ
S1A−S2A/S1B−S2B, R
L
= 50 Ω,
C
L
= 5 pF, f = 100 kHz; Figure 28
−67 dB typ
S1A−S1B/S2A−S2B, R
L
= 50 Ω,
C
L
= 5 pF, f = 100 kHz; Figure 27
Total Harmonic Distortion (THD + N) 0.02 %
R
L
= 32 Ω, f = 20 Hz to 20 kHz,
V
S
= 2 V p-p
Insertion Loss −0.05 dB typ R
L
= 50 Ω, C
L
= 5 pF; Figure 26
−3 dB Bandwidth 57 MHz typ R
L
= 50 Ω, C
L
= 5 pF; Figure 26
C
S
(OFF) 25 pF typ
C
D
, C
S
(ON) 75 pF typ
POWER REQUIREMENTS V
DD
= 3.6 V
I
DD
0.003 µA typ Digital inputs = 0 V or 3.6 V
1 4 µA max
1
Temperature range for Y version is −40°C to +125°C.
2
Guaranteed by design, not subject to production test.