Datasheet

ADG836L
Rev. A | Page 4 of 16
Table 2. V
DD
= 2.5 V ± 0.2 V, GND = 0 V, unless otherwise noted.
1
Parameter +25°C −40°C – +85°C −40°C – +125°C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V
DD
V
On Resistance (R
ON
) 0.65 typ V
DD
= 2.3 V, V
S
= 0 V to V
DD
, I
S
= 10 mA
0.72 0.8 0.88 Ω max (Figure 18)
On Resistance Match between 0.04 Ω typ V
DD
= 2.3 V, V
S
= 0.7 V, I
S
= 10 mA
Channels (∆R
ON
) 0.08 0.085 max
On Resistance Flatness (R
FLAT (ON)
) 0.16 typ V
DD
= 2.3 V, V
S
= 0 V to V
DD
, I
S
= 10 mA
0.23 0.24 max
LEAKAGE CURRENTS V
DD
= 2.7 V
Source Off Leakage I
S
(OFF) ±0.2 nA typ V
S
= 0.6 V/2.4 V, V
D
= 2.4 V/0.6 V
±0.4 ±4 ±45 nA max (Figure 19)
Channel On Leakage I
D
, I
S
(ON) ±0.2 nA typ V
S
= V
D
= 0.6 V or 2.4 V (Figure 20)
±0.6 ±12 ±90 nA max
DIGITAL INPUTS
Input High Voltage, V
INH
1.7 V min
Input Low Voltage, V
INL
0.7 V max
Input Current
I
INL
or I
INH
0.005 µA typ V
IN
= V
INL
or V
INH
±0.1 µA max
C
IN
, Digital Input Capacitance 4 pF typ
DYNAMIC CHARACTERISTICS
2
t
ON
23 ns typ R
L
= 50 Ω, C
L
= 35 pF
29 30 31 ns max V
S
= 1.5 V/0 V (Figure 21)
t
OFF
5 ns typ R
L
= 50 Ω, C
L
= 35 pF
7 8 9 ns max V
S
= 1.5 V (Figure 21)
Break-before-Make Time Delay
(t
BBM
)
17 ns typ R
L
= 50 Ω, C
L
= 35 pF
5 ns min V
S1
= V
S2
= 1.5 V (Figure 22)
Charge Injection 30 pC typ V
S
= 1.25 V, R
S
= 0 Ω, C
L
= 1 nF (Figure 23)
Off Isolation −67 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 100 kHz (Figure 24)
Channel-to-Channel Crosstalk 90 dB typ S1A−S2A/S1B−S2B;
R
L
= 50 V, C
L
= 5 pF, f = 100 kHz;Figure 27
−67 dB typ S1A−S1B/S2A−S2B;
R
L
= 50 Ω, C
L
= 5 pF, f = 100 kHz Figure 25
Total Harmonic Distortion
(THD + N)
0.022 % R
L
= 32 Ω, f = 20 Hz to 20 kHz, V
S
= 1.5 V p-p
Insertion Loss −0.06 dB typ R
L
= 50 Ω, C
L
= 5 pF (Figure 25)
–3 dB Bandwidth 57 MHz typ R
L
= 50 Ω, C
L
= 5 pF (Figure 25)
C
S
(OFF) 25 pF typ
C
D
, C
S
(ON) 75 pF typ
POWER REQUIREMENTS V
DD
= 2.7 V
I
DD
0.003 µA typ Digital inputs = 0 V or 2.7 V
1 4 µA max
1
Temperature range for Y version is 40°C to +125°C.
2
Guaranteed by design, not subject to production test.