Datasheet
ADG821/ADG822/ADG823
Rev. A | Page 9 of 12
TEST CIRCUITS
SD
V
S
I
DS
V1
R
ON
= V1/I
DS
0
2851-017
SD
V
S
A A
V
D
I
S
(OFF) I
D
(OFF)
02851-018
SD
A
V
D
I
D
(ON)
NC
NC = NO CONNECT
0
2851-019
Figure 17. On Resistance Figure 18. Off Leakage Figure 19. On Leakage
V
S
IN
S
D
GND
R
L
50
C
L
35pF
V
OUT
V
DD
0.1µF
V
DD
ADG821
ADG822
V
IN
V
IN
V
OUT
t
ON
t
OFF
50% 50%
90% 90%
50% 50%
02851-020
Figure 20. Switching Times
V
S2
IN1,
IN2
V
IN
S2 D2
V
S1
S1 D1
GND
R
L2
50
C
L2
35pF
V
OUT2
V
OUT1
V
DD
0.1µF
V
DD
V
IN
V
OUT1
V
OUT2
t
BBM
t
BBM
50% 50%
90%
90%
90%
90%
0V
0V
0V
R
L1
50
C
L1
35pF
02851-021
Figure 21. Break-Before-Make Time Delay, t
BBM
(ADG823 only)
IN
V
OUT
V
IN
V
OUT
V
OUT
SW OFFSW ON
Q
INJ
= C
L
× V
OUT
S
D
V
DD
V
DD
V
S
R
S
GND
C
L
1nF
02851-022
Figure 22. Charge Injection