Datasheet
ADG811/ADG812/ADG813
Rev. B | Page 11 of 16
TEST CIRCUITS
V
S
R
ON
= V1/I
DS
I
DS
V1
04306-A-018
SD
Figure 19. On Resistance
V
S
V
D
I
S
(OFF) I
D
(OFF)
A A
SD
04306-A-019
Figure 20. Off Leakage
V
D
I
D
(ON)
NC
SD
A
04306-A-020
Figure 21. On Leakage
SD
IN
GND
R
L
50Ω
C
L
35pF
V
DD
V
IN
V
OUT
V
IN
V
OUT
V
S
V
DD
t
ON
t
OFF
50% 50%
90% 90%
50% 50%
0.1μF
ADG811
ADG812
04306-A-021
Figure 22. Switching Times
IN1, IN2
S1 D1
0.1μF
GND
R
L2
50Ω
R
L1
50Ω
S2
D2
V
DD
V
OUT2
V
OUT1
V
S1
V
S2
V
IN
V
DD
C
L1
35pF
C
L2
35pF
V
OUT
V
IN
t
BBM
t
BBM
50% 50%
80%
0V
80%
04306-A-022
Figure 23. Break-Before-Make Time Delay, t
BBM
(ADG813 Only)
IN
GND
C
L
1nF
V
DD
SD
R
S
V
S
V
IN
V
OUT
V
OUT
V
DD
SW ON
Q
INJ
= C
L
×ΔV
OUT
SW OFF
ΔV
OUT
04306-A-023
Figure 24. Charge Injection