Datasheet

Data Sheet ADG772
Rev. B | Page 3 of 12
SPECIFICATIONS
V
DD
= 2.7 V to 3.6 V, GND = 0 V, unless otherwise noted.
Table 1.
Parameter +25°C −40°C to +85°C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V
DD
V
On-Resistance (R
ON
) 6.7 Ω typ V
DD
= 2.7 V, V
S
= 0 V to V
DD
, I
DS
= 10 mA; see Figure 21
8.8 Ω max
On-Resistance Match 0.04 Ω typ V
DD
= 2.7 V, V
S
= 1.5 V, I
DS
= 10 mA
Between Channels (∆R
ON
) 0.2 Ω max
On Resistance Flatness (R
FL AT (O N)
)
3.3
Ω typ
V
DD
= 2.7 V, V
S
= 0 V to V
DD
, I
DS
= 10 mA
3.6 Ω max
LEAKAGE CURRENTS V
DD
= 3.6 V
Source Off Leakage I
S
(Off ) ±0.2 nA typ V
S
= 0.6 V/3.3 V, V
D
= 3.3 V/0.6 V; see Figure 22
Channel On Leakage I
D
, I
S
(On) ±0.2 nA typ V
S
= V
D
= 0.6 V or 3.3 V; see Figure 23
DIGITAL INPUTS
Input High Voltage, V
INH
1.35
V min
Input Low Voltage, V
INL
0.8 V max
Input Current, I
INL
or I
INH
0.005 µA typ V
IN
= V
INL
or V
INH
±0.1 µA max V
IN
= V
INL
or V
INH
Digital Input Capacitance, C
IN
2 pF typ
DYNAMIC CHARACTERISTICS
1
t
ON
9 ns typ R
L
= 50 Ω, C
L
= 35 pF
12.5 13.5 ns max V
S
= 2 V; see Figure 24
t
OFF
6 ns typ R
L
= 50 Ω, C
L
= 35 pF
9.5 10 ns max V
S
= 2 V; see Figure 24
Propagation Delay 250 ps typ R
L
= 50 Ω, C
L
= 35 pF
Propagation Delay Skew, t
SKEW
20 ps typ R
L
= 50 Ω, C
L
= 35 pF
Break-Before-Make Time Delay (t
BBM
) 5 ns typ R
L
= 50 Ω, C
L
= 35 pF
3.4 2.9 ns min V
S1
= V
S2
= 2 V; see Figure 25
Charge Injection
0.5
pC typ
V
D
= 1.25 V, R
S
= 0 Ω, C
L
= 1 nF; see Figure 26
Off Isolation 73 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz; see Figure 27
Channel-to-Channel Crosstalk −90 dB typ S1A to S2A/S1B to S2B; R
L
= 50 Ω, C
L
= 5 pF,
f = 1 MHz; see Figure 28
−80 dB typ S1A to S1B/S2A to S2B; R
L
= 50 Ω, C
L
= 5 pF,
f = 1 MHz; see Figure 29
−3 dB Bandwidth 630 MHz typ R
L
= 50 Ω, C
L
= 5 pF; see Figure 30
Data Rate 1260 Mbps typ R
L
= 50 Ω, C
L
= 5 pF; see Figure 30
C
S
(Off ) 2.4 pF typ
C
D
, C
S
(On) 6.9 pF typ
POWER REQUIREMENTS V
DD
= 3.6 V
I
DD
0.006 µA typ Digital inputs = 0 V or 3.6 V
1 µA max
1
Guaranteed by design, not subject to production test.