Datasheet

REV. A
ADG725/ADG731
–3–
SPECIFICATIONS
1
(V
DD
= 3 V  10%, V
SS
= 0 V, GND = 0 V, unless otherwise noted.)
B Version
Parameter +25⬚C –40⬚C to +85⬚C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 to V
DD
V
On Resistance (R
ON
)7 Ω typ V
S
= 0 V to V
DD
, I
DS
= 10 mA;
11 12 Ω max Test Circuit 1
On Resistance Match between 0.35 Ω typ V
S
= 0 V to V
DD
, I
DS
= 10 mA
Channels (∆R
ON
)1Ω max
On Resistance Flatness (R
FLAT(ON)
)3Ω max V
S
= 0 V to V
DD
, I
DS
= 10 mA
LEAKAGE CURRENTS V
DD
= 3.3 V
Source OFF Leakage I
S
(OFF) ± 0.01 nA typ V
S
= 3 V/1 V, V
D
= 1 V/3 V;
± 0.25 ± 1nA max Test Circuit 2
Drain OFF Leakage I
D
(OFF) ± 0.05 nA typ V
S
= 1 V/3 V, V
D
= 3 V/1 V;
ADG725 ± 0.5 ± 2.5 nA max Test Circuit 3
ADG731 ± 1 ± 5nA max
Channel ON Leakage I
D
, I
S
(ON) ±0.05 nA typ V
S
= V
D
= 1 V or 3 V;
ADG725 ± 0.5 ± 2.5 nA max Test Circuit 4
ADG731 ± 1 ± 5nA max
DIGITAL INPUTS
Input High Voltage, V
INH
2.0 V min
Input Low Voltage, V
INL
0.7 V max
Input Current
I
INL
or I
INH
0.005 µA typ V
IN
= V
INL
or V
INH
± 0.5 µA max
C
IN
, Digital Input Capacitance 5 pF typ
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
60 ns typ R
L
= 300 Ω, C
L
= 35 pF; Test Circuit 5
80 90 ns max V
S1
= 2 V/0 V, V
S32
= 0 V/2 V
Break-Before-Make Time Delay, t
D
30 ns typ R
L
= 300 Ω, C
L
= 35 pF
1 ns min V
S
= 2 V; Test Circuit 6
Charge Injection 1 pC typ V
S
= 0 V, R
S
= 0 Ω, C
L
= 1 nF;
Test Circuit 7
Off Isolation –72 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz;
Test Circuit 8
Channel-to-Channel Crosstalk –72 dB typ R
L
= 50 Ω, C
L
= 5 pF, f = 1 MHz;
Test Circuit 9
–3 dB Bandwidth
ADG725 34 MHz typ R
L
= 50 Ω, C
L
= 5 pF; Test Circuit 10
ADG731 18 MHz typ
C
S
(OFF) 15 pF typ f = 1 MHz
C
D
(OFF)
ADG725 170 pF typ f = 1 MHz
ADG731 340 pF typ f = 1 MHz
C
D
, C
S
(ON)
ADG725 175 pF typ f = 1 MHz
ADG731 350 pF typ f = 1 MHz
POWER REQUIREMENTS V
DD
= 3.3 V
I
DD
5 µA typ Digital Inputs = 0 V or 3.3 V
10 µA max
NOTES
1
Temperature range is as follows: B Version: –40°C to +85°C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.