Datasheet

REV. A–12–
ADG725/ADG731
50%
V
OUT
t
TRANSITION
90%
90%
t
TRANSITION
SCLK
50%
V
OUT
D
V
S1
*SIMILAR CONNECTION FOR ADG725
GND
ADG731*
S1
S32
S2 TO S31
V
S32
R
L
300

C
L
35pF
V
DD
V
DD
V
SS
V
SS
VS1
VS32
8TH FALLING EDGE
8TH FALLING EDGE
Test Circuit 5. Switching Time of Multiplexer, t
TRANSITION
V
DD
V
DD
V
OUT
D
V
S
ADG731*
S
1
S32
R
L
30 0

C
L
35pF
t
OPE N
80%
80%
0V
V
S
SCLK
*SIMILAR CONNECTION FOR ADG725
V
SS
V
SS
GND
V
OUT
S2 THRU S31
8TH FALLING EDGE
Test Circuit 6. Break-Before-Make Delay, t
OPEN

V
OUT
V
OUT
SCLK
Q
INJ
= C
L

V
OUT
V
OUT
D
ADG731*
C
L
1nF
S
R
S
V
S
V
DD
V
DD
*SIMILAR CONNECTION FOR ADG725
GND
V
SS
V
SS
8th FALLING EDGE
Test Circuit 7. Charge Injection
TEST CIRCUITS (continued)