Datasheet

ADG728/ADG729
–11–
TEST CIRCUITS
I
DS
S
V
S
D
V
1
R
ON
= V
1
/I
DS
Test Circuit 1. On Resistance
I
S
(OFF)
S1
S2
S8
D
A
GND
V
DD
V
DD
V
D
V
S
Test Circuit 2. I
D
(OFF)
S1
S2
S8
D
GND
V
DD
V
DD
V
S
A
I
D
(OFF)
V
D
Test Circuit 3. I
S
(OFF)
S1
S8
D
GND
V
DD
V
DD
V
S
A
I
D
(ON)
V
D
Test Circuit 4. I
D
(ON)
GND
V
DD
V
DD
50%
t
OFF
90%
90%
50%
V
S1
80%
80%
V
S1
= V
S8
V
OUT
V
OUT
t
ON
t
OPEN
SCL
V
OUT
D
V
S1
ADG728*
S1
S8
S2 THRU S7
R
L
300⍀
C
L
35pF
V
S8
* SIMILAR CONNECTION FOR ADG729
Test Circuit 5. Switching Times and Break-Before-Make Times
MULTIPLE DEVICES ON ONE BUS
Figure 20 shows four ADG728s devices on the same serial bus.
Each has a different slave address since the state of their A0 and
A1 pins is different. This allows each Matrix Switch to be writ-
ten to or read from independently. Because the ADG729 has a
different address to the ADG728, it would be possible for four
of each of these devices to be connected to the same bus.
ADG728
A1
A0
SDA SCL
ADG728
A1
A0
SDA SCL
ADG728
A1
A0
SDA SCL
ADG728
A1
A0
SDA SCL
SCL
SDA
+5V
V
DD
MASTER
R
P
R
P
V
DD
V
DD
Figure 20. Multiple ADG728s on the Same Bus
REV. C