Datasheet

REV. 0
–3–
ADG604
SINGLE SUPPLY
1
(V
DD
= 5 V  10%, V
SS
= 0 V, GND = 0 V. All specifications –40C to +125C unless otherwise noted.)
–40C to –40C to
Parameter 25C +85C +125C Unit Test Conditions/Comments
ANALOG SWITCH
Analog Signal Range 0 V to V
DD
V
V
DD
= 4.5 V, V
SS
= 0 V
On Resistance (R
ON
) 210 Ω Typ V
S
= 3.5 V, I
S
= –1 mA,
290 350 380 Ω Max Test Circuit 1
On Resistance Match Between
Channels (⌬R
ON
)3 Ω Typ V
S
= 3.5 V, I
S
= –1 mA
12 13 Ω Max
LEAKAGE CURRENTS V
DD
= 5.5 V
Source OFF Leakage I
S
(OFF) ± 0.01 nA Typ V
S
= 1 V/4.5 V, V
D
= 4.5 V/1 V,
± 0.1 ± 0.25 ± 4 nA Max Test Circuit 2
Drain OFF Leakage I
D
(OFF) ± 0.01 nA Typ V
S
= 1 V/4.5 V, V
D
= 4.5 V/1 V,
± 0.1 ± 0.5 ± 8 nA Max Test Circuit 2
Channel ON Leakage I
D
, I
S
(ON) ± 0.01 nA Typ V
S
= V
D
= 4.5 V/1 V,
± 0.1 ± 0.5 10 nA Max Test Circuit 3
DIGITAL INPUTS
Input High Voltage, V
INH
2.4 V Min
Input Low Voltage, V
INL
0.8 V Max
Input Current
I
INL
or I
INH
0.005 µA Typ V
IN
= V
INL
or V
INH
± 0.1 µA Max
C
IN
, Digital Input Capacitance 2 pF Typ
DYNAMIC CHARACTERISTICS
2
Transition Time 90 ns Typ V
S1
= 3 V, V
S4
= 0 V, R
L
= 300 Ω,
150 185 210 ns Max C
L
= 35 pF, Test Circuit 4
t
ON
Enable 105 ns Typ R
L
= 300 Ω, C
L
= 35 pF
150 190 220 ns Max V
S
= 3 V, Test Circuit 6
t
OFF
Enable 45 ns Typ R
L
= 300 Ω, C
L
= 35 pF
70 80 90 ns Max V
S
= 3 V, Test Circuit 6
Break-Before-Make Time Delay, t
BBM
30 ns Typ R
L
= 300 Ω, C
L
= 35 pF,
10 ns Min V
S1
= V
S2
= 3 V, Test Circuit 5
Charge Injection 0.3 pC Typ V
S
= 0 V , R
S
= 0 Ω, C
L
= 1 nF,
Test Circuit 7
Off Isolation –65 dB Typ R
L
= 50 Ω, C
L
= 5 pF, f = 10 MHz,
Test Circuit 8
Channel-to-Channel Crosstalk –70 dB Typ R
L
= 50 Ω, C
L
= 5 pF, f = 10 MHz,
Test Circuit 10
Bandwidth –3 dB 250 MHz Typ R
L
= 50 Ω, C
L
= 5 pF, Test Circuit 9
C
S
(OFF) 5 pF Typ f = 1 MHz
C
D
(OFF) 17 pF Typ f = 1 MHz
C
D
, C
S
(ON) 18 pF Typ f = 1 MHz
POWER REQUIREMENTS V
DD
= 5.5 V
Digital Inputs = 0 V or 5.5 V
I
DD
0.001 µA Typ
1.0 µA Max
NOTES
1
Y Version Temperature Range: –40°C to +125°C
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.