Datasheet

ManualsBrandsANALOG DEVICES ManualsInterface ICsInterface IC - multiplexers SOIC 28 W

1

2

3

4

5

6

7

ADG506A/ADG507A

–6–

REV. C

–Test Circuits

Note: All Digital Input Signal Rise and Fall Times Measured from 10% to 90% of 3 V. t

R

= t

F

= 20 ns.

Test Circuit 6. Switching Time of Multiplexer, t

TRANSITION

Test Circuit 7. Break-Before-Make Delay, t

OPEN

Test Circuit 1. R

ON

Test Circuit 2. I

S

(OFF)

Test Circuit 3. I

D

(OFF)

Test Circuit 4. I

D

(ON)

Test Circuit 5. I

DIFF