Datasheet

ADG1311/ADG1312/ADG1313
Rev. A | Page 10 of 12
TEST CIRCUITS
I
DS
V1
SD
V
S
R
ON
= V1/I
DS
05676-020
SD
V
S
A A
V
D
I
S
(OFF) I
D
(OFF)
05676-021
SD
A
V
D
I
D
(ON)
NC
NC = NO CONNECT
05676-022
Figure 10. On Resistance Figure 11. Off Leakage Figure 12. On Leakage
V
S
IN
SD
GND
R
L
300Ω
C
L
35pF
V
OUT
V
DD
V
SS
0.1μF
V
DD
0.1μF
V
SS
ADG1312
ADG1311
V
IN
V
IN
V
OUT
t
ON
t
OFF
50% 50%
90% 90%
50% 50%
05676-023
Figure 13. Switching Times
V
S2
IN1,
IN2
S2 D2
V
S1
S1 D1
GND
R
L
300Ω
C
L
35pF
V
OUT2
V
OUT1
V
DD
V
SS
0.1μF
V
DD
0.1μF
V
SS
V
IN
V
OUT1
V
OUT2
ADG1313
t
D
t
D
50% 50%
90%
90%
90%
90%
0V
0V
0V
R
L
300Ω
C
L
35pF
05676-024
Figure 14. Break-Before-Make Time Delay
IN
V
OUT
ADG1312
ADG1311
V
IN
V
IN
V
OUT
OFF
ΔV
OUT
ON
Q
INJ
= C
L
×ΔV
OUT
SD
V
DD
V
SS
V
DD
V
SS
V
S
R
S
GND
C
L
1nF
05676-025
Figure 15. Charge Injection