Datasheet

ADG1236
Rev. 0 | Page 12 of 16
TEST CIRCUITS
I
DS
SD
V
S
04776-020
V
SD
V
S
A A
V
D
I
S
(OFF) I
D
(OFF)
04776-021
SD
A
V
D
I
D
(ON)
NC
NC = NO CONNECT
04776-022
Figure 20. Test Circuit 1—On Resistance Figure 21. Test Circuit 2—Off Resistance Figure 22. Test Circuit 3—On Leakage
04776-023
IN
V
OUT
D
SA
V
DD
V
SS
V
DD
V
SS
GND
C
L
35pF
SB
V
IN
V
S
0.1μF0.1μF
R
L
300Ω
50%
50%
90%
50%
50%
90%
t
ON
t
OFF
V
IN
V
OUT
V
IN
Figure 23. Test Circuit 4—Switching Times
04776-024
IN
V
OUT
D
SA
V
DD
V
SS
V
DD
V
SS
GND
C
L
35pF
SB
V
IN
V
S
0.1μF0.1μF
R
L
300Ω
80%
t
BBM
t
BBM
V
OUT
V
IN
Figure 24. Test Circuit 5—Break-Before-Make Time Delay
V
IN
(NORMALLY
CLOSED SWITCH)
V
OUT
V
IN
(NORMALLY
OPEN SWITCH)
OFF
ΔV
OUT
ON
Q
INJ
= C
L
×ΔV
OUT
04776-025
IN
V
OUT
D
SA
V
DD
V
SS
V
DD
V
SS
GND
C
L
1nF
NC
SB
V
IN
V
S
0.1μF0.1μF
Figure 25. Test Circuit 6—Charge Injection