Datasheet

REV. A–6–
ADE7757–Typical Performance Characteristics
CURRENT – A
0.5
0.01 0.1 1 10 100
% ERROR
–0.5
–0.4
–0.3
–0.2
–0.1
0
0.1
0.2
0.3
0.4
+85C
+25C
–40C
PF = 1
ON-CHIP REFERENCE
TPC 1. Error as a % of Reading over Temperature
with On-Chip Reference (PF = 1)
CURRENT – A
0.01 0.1 1 10 100
% ERROR
–0.5
–0.3
–0.1
0.1
0.3
0.5
0.7
0.9
PF = 0.5
ON-CHIP REFERENCE
–40C, PF = 0.5
+25C, PF = 1.0
+85C, PF = 0.5
–25C, PF = 0.5
TPC 2. Error as a % of Reading over Temperature
with On-Chip Reference (PF = 0.5)
CURRENT – A
0.01 0.1 1 10 100
% ERROR
–1.0
–0.8
–0.6
–0.4
–0.2
0.2
0.6
1.0
PF = 1
EXTERNAL REFERENCE
+85C
–40C
+25C
0
0.4
0.8
TPC 3. Error as a % of Reading over Temperature
with External Reference (PF = 1)
CURRENT – A
0.01 0.1 1 10 100
% ERROR
–1.0
–0.8
–0.6
–0.4
–0.2
0.2
0.6
1.0
PF = 0.5
EXTERNAL REFERENCE
0
0.4
0.8
+25C, PF = 1.0
+85C, PF = 0.5
+25C, PF = 0.5
–40C, PF = 0.5
TPC 4. Error as a % of Reading over Temperature
with External Reference (PF = 0.5)
6.2k
V2N
200
220V
150nF
V2P
200
602k
V1P
V1N
350
40A TO
40mA
REF
IN/OUT
100nF
1F
100nF
10F
V
DD
DGND
F1
F2
CF
REVP
RCLKIN
S0
S1
SCF
10nF 10nF 10nF
U3
PS2501-1
K7
K8
U1
ADE7757
10k
V
DD
200
200
150nF
150nF
AGND
150nF
V
DD
Figure 2. Test Circuit for Performance Curves