Datasheet

Data Sheet ADA4857-1/ADA4857-2
Rev. C | Page 15 of 20
TEST CIRCUITS
V
IN
R
S
V
OUT
0.1µF
0.1µF
0.1µF
10µF
+V
S
–V
S
49.9Ω
07040-047
R
L
+
10µF
+
Figure 42. Noninverting Load Configuration
V
OUT
0.1µF
49.9Ω
+V
S
–V
S
07040-045
R
L
10µF
+
AC
Figure 43. Positive Power Supply Rejection
V
IN
V
OUT
0.1µF
0.1µF
0.1µF
10µF
+V
S
–V
S
49.9Ω
07040-051
R
L
R
F
R
G
C
L
+
10µF
+
Figure 44. Typical Capacitive Load Configuration (LFCSP)
V
IN
V
OUT
0.1µF
0.1µF
0.1µF
10µF
+V
S
–V
S
1kΩ
1kΩ
1kΩ
1kΩ
07040-046
53.6Ω
R
L
+
10µF
+
Figure 45. Common-Mode Rejection
0.1µF
V
OUT
+V
S
–V
S
07040-048
R
L
10µF
+
AC
49.9Ω
Figure 46. Negative Power Supply Rejection
V
IN
V
OUT
0.1µF 0.1µF
0.1µF
10µF
+V
S
–V
S
R
G
R
F
49.9Ω
07040-049
R
L
C
L
+
10µF
+
40Ω
R
SNUB
Figure 47. Typical Capacitive Load Configuration (SOIC)