Datasheet

Data Sheet ADA4817-1/ADA4817-2
Rev. B | Page 13 of 28
TEST CIRCUITS
The output feedback pins are used for ease of layout as shown in Figure 35 to Figure 40.
V
IN
V
OUT
0.1µF
0.1µF
0.1µF
10µF
+V
S
–V
S
49.9Ω
R
L
+
10µF
+
07756-147
Figure 35. G = 1 Configuration
V
OUT
0.1µF
49.9Ω
+V
S
–V
S
R
L
10µF
+
AC
07756-145
Figure 36. Positive Power Supply Rejection
V
IN
V
OUT
0.1µF
0.1µF
10µF
+V
S
–V
S
49.9Ω
R
L
0.1µF
C
L
+
10µF
+
R
F
R
SNUB
R
G
07756-142
Figure 37. Capacitive Load Configuration
V
IN
V
OUT
0.1µF
0.1µF
0.1µF
10µF
+V
S
–V
S
49.9Ω
R
L
+
10µF
+
R
F
R
G
07756-141
Figure 38. Noninverting Gain Configuration
0.1µF
V
OUT
+V
S
–V
S
R
L
10µF
+
AC
49.9Ω
07756-148
Figure 39. Negative Power Supply Rejection
V
IN
V
OUT
0.1µF
0.1µF
0.1µF
10µF
+V
S
–V
S
1kΩ
1kΩ
1kΩ
1kΩ
53.6Ω
R
L
+
10µF
+
07756-146
Figure 40. Common-Mode Rejection