Datasheet

ADA4430-1
Rev. C | Page 11 of 20
TEST CIRCUITS
2.6k
2.6k
2.6k
1.3k
SAG
GND
V
IN
V
OUT
DIS
V
S
ADA4430-1
1
2
3
4
5
6
118
R
L
= 150
5086.6
0.1µF
TEST GENERATOR
V
S+
05885-038
50
50
TEST RECEIVER
0.5V
×1
Figure 25. Test Circuit Used for Frequency Sweeps and Time-Domain Tests
2.6k
2.6k
2.6k
1.3k
SAG
GND
V
IN
V
OUT
ADA4430-1
1
2
3
4
5
6
75
R
L
= 150
75
0.1µF
TEST GENERATO
R
DIS
V
S
V
S+
05885-039
75
150
150
TEST RECEIVER
1.0V
220µF
×1
Figure 26. Test Circuit Used for Differential Gain, Differential Phase, and Noise Tests