Datasheet

Data Sheet AD9515
Rev. A | Page 27 of 28
PHASE NOISE AND JITTER MEASUREMENT SETUPS
AD9515
CLK1
OUT1
OUT1B
BALUN
TERM
TERM
AMP
+28dB
ZFL1000VH2
ATTENUATOR
–12dB
EVALUATION BOARD
AD9515
CLK1
OUT1
OUT1B
BALUN
TERM
TERM
AMP
+28dB
ZFL1000VH2
ATTENUATOR
–7dB
SIG IN
REF IN
EVALUATION BOARD
WENZEL
OSCILLATOR
0°
SPLITTER
ZESC-2-11
VARIABLE DELAY
COLBY PDL30A
0.01ns STEP
TO 10ns
AGILENT E5500B
PHASE NOISE MEASUREMENT SYSTEM
05597-041
Figure 41. Additive Phase Noise Measurement Configuration
AD9515
CLK1
OUT1
OUT1B
BALUN
TERM
CLK
ANALOG
SOURCE
TERM
EVALUATION BOARD
WENZEL
OSCILLATOR
WENZEL
OSCILLATOR
DATA CAPTURE CARD
FIFO
FFT
PC
ADC
SNR
t
J_RMS
05597-042
Figure 42. Jitter Determination by Measuring SNR of ADC
( ) ( )
[ ]
2
222
2
2
20
2π
θθθ
10
A_PKA
DNLTHERMALONQUANTIZATI
SNR
A_RMS
J_RMS
Vf
BWSND
V
t
××
++−×−








=
where:
t
j_RMS
is the rms time jitter.
SNR is the signal-to-noise ratio.
SND is the source noise density in nV/√Hz.
BW is the SND filter bandwidth.
V
A
is the analog source voltage.
f
A
is the analog frequency.
The θ terms are the quantization, thermal, and DNL errors.