Datasheet

AD9514
Rev. 0 | Page 27 of 28
PHASE NOISE AND JITTER MEASUREMENT SETUPS
A
D
9
5
1
4
C
L
K
1
O
U
T
1
O
U
T
1
B
BALUN
TERM
TERM
AMP
+28dB
ZFL1000VH2
ATTENUATOR
–12dB
EVALUATION BOARD
A
D
9
5
1
4
C
L
K
1
O
U
T
1
O
U
T
1
B
BALUN
TERM
TERM
AMP
+28dB
ZFL1000VH2
ATTENUATOR
–7dB
SIG IN
REF IN
EVALUATION BOARD
WENZEL
OSCILLATOR
0°
SPLITTER
ZESC-2-11
VARIABLE DELAY
COLBY PDL30A
0.01ns STEP
TO 10ns
AGILENT E5500B
PHASE NOISE MEASUREMENT SYSTEM
05596-041
Figure 41. Additive Phase Noise Measurement Configuration
A
D
9
5
1
4
C
L
K
1
O
U
T
1
O
U
T
1
B
BALUN
TERM
CLK
ANALOG
SOURCE
TERM
EVALUATION BOARD
WENZEL
OSCILLATOR
WENZEL
OSCILLATOR
DATA CAPTURE CARD
FIFO
FFT
PC
ADC
SNR
t
J_RMS
05596-042
Figure 42. Jitter Determination by Measuring SNR of ADC
() ()
[]
2
222
2
2
20
2π
θθθ
10
A_PKA
DNLTHERMALONQUANTIZATI
SNR
A_RMS
J_RMS
Vf
BWSND
V
t
××
++−×−
⎥
⎥
⎦
⎤
⎢
⎢
⎣
⎡
=
where:
t
j_RMS
is the rms time jitter.
SNR is the signal-to-noise ratio.
SND is the source noise density in nV/√Hz.
BW is the SND filter bandwidth.
V
A
is the analog source voltage.
f
A
is the analog frequency.
The θ terms are the quantization, thermal, and DNL errors.