Datasheet

AD9218
Rev. C | Page 8 of 28
ABSOLUTE MAXIMUM RATINGS
EXPLANATION OF TEST LEVELS
Table 5.
Parameter Rating
I. 100% production tested.
V
D
, V 4 V
DD
II. 100% production tested at 25°C and sample tested at
specified temperatures.
Analog Inputs –0.5 V to V
D
+ 0.5 V
Digital Inputs –0.5 V to V + 0.5 V
DD
REF
IN
Inputs –0.5 V to V
D
+ 0.5 V
III. Sample tested only.
Digital Output Current 20 mA
IV. Parameter is guaranteed by design and characterization
testing.
Operating Temperature –55°C to +125°C
Storage Temperature –65°C to +150°C
Maximum Junction Temperature 150°C
V. Parameter is a typical value only.
Maximum Case Temperature 150°C
θ
A
(measured on a 4-layer board with
solid ground plane)
57°C/W
VI. 100% production tested at 25°C; guaranteed by design
and characterization testing for industrial temperature
range.
100% production tested at temperature extremes for
military devices.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 6. User Select Modes
S1 S2 Power-Down and Data Alignment Settings
0 0 Power down both Channel A and Channel B.
0 1 Power down Channel B only.
1 0 Normal operation (data align disabled).
1 1
Data align enabled (data from both channels
available on rising edge of Clock A. Channel B data is
delayed by a ½ clock cycle.)
ESD CAUTION