Datasheet

AD8366
Rev. A | Page 22 of 28
CHARACTERIZATION SETUPS
Figure 58 and Figure 59 are characterization setups used
extensively to characterize the AD8366. Characterization was
done on single-ended and differential evaluation boards. The
bulk of the characterization was done using an automated VEE
program to control the equipment as shown in Figure 58. This
setup was used to measure P1dB, OIP3, OIP2, IMD2, IMD3,
harmonic distortion, gain, gain error, supply current, and noise
density. All measurements were done with a 200 Ω load. All balun,
output matching network, and filter losses were de-embedded.
Gain error was measured with constant input power. All other
measurements were done on 2 V p-p (4 dBm, re: 200 Ω) on
the output of the device under test (DUT), and 2 V p-p composite
output for two-tone measurements. To measure harmonic
distortion, band-pass and band-reject filters were used on
the input and output of the DUT.
Figure 59 shows the setup used to make differential measurements.
All measurements on this setup were done in a 50 Ω system and
post processed to reference the measurements to a 200 Ω system.
Gain and phase mismatch were measured with 2 V p-p on the
output, and small signal frequency responses were measured
with −30 dBm on the input of the DUT.