Datasheet

Data Sheet AD8335
Rev. B | Page 15 of 28
TEST CIRCUITS
28Ω
237Ω
249Ω
1:1
NETWORK AN
A
LYZ E
R
AD8335
18nF
22pF
50Ω
IN
OUT
0.1µF
237Ω
28Ω
0.1µF
0.1µF
50Ω
49.9Ω
0.1µF
04976-048
Figure 49. Test Circuit for Gain and Bandwidth Measurements
1:1
AD8335
22pF
0.1µF
0.1µF
0.1µF
49Ω
0.1µF
IN
50Ω
SPECTRUM
ANALYZER
04976-050
Figure 50. Test Circuit for Noise Measurements
28Ω
237Ω
249Ω
1:1
AD8335
18nF
22pF
0.1µF
237Ω
28Ω
0.1µF
0.1µF
49.9Ω
0.1µF
50Ω
IN
50Ω
OSCILLOSCOPE
04976-049
Figure 51. Test Circuit for Transient Measurements
28Ω
237Ω
249Ω
1:1
NETWORK AN
A
LYZ ER
AD8335
18nF
22pF
50Ω
INOUT
0.1µF
237Ω
28Ω
0.1µF
0.1µF
50Ω
49.9Ω
0.1µF
50Ω
50Ω
04976-052
Figure 52. Test Circuit for S11 Measurements
28Ω
237Ω
249Ω
1:1
AD8335
18nF
22pF
0.1µF
237Ω
28Ω
0.1µF
0.1µF
50Ω
0.1µF
50Ω
IN
50Ω
SPECTRUM
ANALYZER
04976-051
LPF
SIGNAL
GENERATOR
Figure 53. Test Circuit Used for Distortion Measurements