Datasheet

AD8194
Rev. 0 | Page 4 of 16
ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter Rating
AVCC to AVEE 3.7 V
VTTI AVCC + 0.6 V
VTTO AVCC + 0.6 V
Internal Power Dissipation 1.2 W
High Speed Input Voltage AVCC − 1.4 V < V
IN
< AVCC + 0.6 V
High Speed Differential
Input Voltage
2.0 V
Source Select (S_SEL) AVEE − 0.3 V < V
IN
< AVCC + 0.6 V
Storage Temperature Range −65°C to +125°C
Operating Temperature
Range
−40°C to +85°C
Junction Temperature 150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θ
JA
is specified for the worst-case conditions: a device soldered
in a 4-layer JEDEC circuit board for surface-mount packages.
θ
JC
is specified for the exposed pad soldered to the circuit board
with no airflow.
Table 3. Thermal Resistance
Package Type
θ
JA
θ
JC
Unit
32-Lead LFCSP 47 6.8 °C/W
MAXIMUM POWER DISSIPATION
The maximum power that can be safely dissipated by the
AD8194 is limited by the associated rise in junction tempera-
ture. The maximum safe junction temperature for plastic
encapsulated devices is determined by the glass transition
temperature of the plastic, approximately 150°C. Temporarily
exceeding this limit may cause a shift in parametric performance
due to a change in the stresses exerted on the die by the package.
Exceeding a junction temperature of 175°C for an extended
period can result in device failure. To ensure proper operation,
it is necessary to observe the maximum power derating as
determined by the coefficients in
Table 3.
ESD CAUTION