Datasheet
  AD8104/AD8105
Rev. 0 | Page 7 of 36 
ABSOLUTE MAXIMUM RATINGS 
Table 6. 
Parameter Rating 
Analog Supply Voltage 
(VPOS – VNEG) 
6 V 
Digital Supply Voltage 
(VDD – DGND) 
6 V 
Ground Potential Difference 
(VNEG – DGND) 
+0.5 V to −2.5 V 
Maximum Potential Difference 
(VDD – VNEG) 
8 V 
Common-Mode Analog Input 
Voltage 
VNEG to VPOS 
Differential Analog Input Voltage  ±2 V 
Digital Input Voltage  VDD 
Output Voltage  
(Disabled Analog Output) 
(VPOS − 1 V) to (VNEG + 1 V) 
Output Short-Circuit Duration  Momentary 
Output Short-Circuit Current  80 mA 
Storage Temperature Range  −65°C to +125°C 
Operating Temperature Range  −40°C to +85°C 
Lead Temperature 
(Soldering, 10 sec) 
300°C 
Junction Temperature  150°C 
Stresses above those listed under Absolute Maximum Ratings 
may cause permanent damage to the device. This is a stress 
rating only; functional operation of the device at these or any 
other conditions above those indicated in the operational 
section of this specification is not implied. Exposure to absolute 
maximum rating conditions for extended periods may affect 
device reliability. 
THERMAL RESISTANCE 
θ
JA
 is specified for the worst-case conditions, that is, a device 
soldered in a circuit board for surface-mount packages. 
Table 7. Thermal Resistance 
Package Type  θ
JA
 θ
JC
 θ
JB
 ψ
JT
 ψ
JB
 Unit 
304-Ball BGA  14 1  6.5 0.6 5.7 °C/W 
POWER DISSIPATION 
The AD8104/AD8105 are operated with ±2.5 V or +5 V 
supplies and can drive loads down to 100 , resulting in a large 
range of possible power dissipations. For this reason, extra care 
must be taken derating the operating conditions based on 
ambient temperature. 
Packaged in a 304-ball BGA, the AD8104/AD8105 junction-to-
ambient thermal impedance (θ
JA
) is 14°C/W. For long-term 
reliability, the maximum allowed junction temperature of the 
die should not exceed 150°C. Temporarily exceeding this limit 
may cause a shift in parametric performance due to a change in 
stresses exerted on the die by the package. Exceeding a junction 
temperature of 175°C for an extended period can result in 
device failure. The following curve shows the range of allowed 
internal die power dissipations that meet these conditions over 
the −40°C to +85°C ambient temperature range. When using 
Tabl e 6, do not include external load power in the maximum 
power calculation, but do include load current dropped on the 
die output transistors. 
8
4
15 85
MAXIMUM POWER (W)
AMBIENT TEMPERATURE (°C)
T
J
 = 150°C
7
6
5
25 35 45 55 65 75
06612-004
Figure 4. Maximum Die Power Dissipation vs. Ambient Temperature 
ESD CAUTION 










