Datasheet
–7–
REV. B
AD7851
ABSOLUTE MAXIMUM RATINGS
1
(T
A
= 25°C, unless otherwise noted.)
AV
DD
to AGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
DV
DD
to DGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
AV
DD
to DV
DD
. . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +0.3 V
Analog Input Voltage to AGND . . . . . –0.3 V to AV
DD
+ 0.3 V
Digital Input Voltage to DGND . . . . –0.3 V to DV
DD
+ 0.3 V
Digital Output Voltage to DGND . . . –0.3 V to DV
DD
+ 0.3 V
REF
IN
/REF
OUT
to AGND . . . . . . . . . . –0.3 V to AV
DD
+ 0.3 V
Input Current to Any Pin Except Supplies
2
. . . . . . . . . ±10 mA
Operating Temperature Range
Commercial (A, K Versions) . . . . . . . . . . . –40°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 150°C
PDIP Package, Power Dissipation . . . . . . . . . . . . . . . . 450 mW
θ
JA
Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 105°C/W
θ
JC
Thermal Impedance . . . . . . . . . . . . . . . . . . . . .34.7°C/W
Lead Temperature, (Soldering, 10 secs) . . . . . . . . . . 260°C
SOIC, SSOP Package, Power Dissipation . . . . . . . . . 450 mW
θ
JA
Thermal Impedance . . 75°C/W (SOIC), 122.28°C/W (SSOP)
θ
JC
Thermal Impedance . . . 25°C/W (SOIC), 31.25°C/W (SSOP)
PINOUT FOR DIP, SOIC, AND SSOP
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
AD7851
TOP VIEW
(Not to Scale)
CONVST
BUSY
SLEEP
REF
IN
/REF
OUT
AV
DD
AGND
C
REF
1
C
REF
2
AIN(+)
AIN(–)
NC
AGND
SYNC
SCLK
CLKIN
DIN
DOUT
DGND
DV
DD
CAL
SM2
SM1
POLARITY
AMODE
NC = NO CONNECT
ORDERING GUIDE
1
Linearity
Temperature Error Throughput Throughput Package
Model Range (LSB)
2
Rate (kSPS) at 125ⴗC (kSPS) Description Options
3
AD7851AN –40°C to +85°C ±2 333 238 PDIP N-24
AD7851KN 0°C to 85°C ±1 285 238 PDIP N-24
AD7851AR –40°C to +85°C ±2 333 238 SOIC R-24
AD7851AR-REEL –40°C to +85°C ±2 333 238 SOIC R-24
AD7851ARZ
3
–40°C to +85°C ±2 333 238 SOIC R-24
AD7851ARZ-REEL
3
–40°C to +85°C ±2 333 238 SOIC R-24
AD7851KR 0°C to 85°C ± 1 285 238 SOIC R-24
AD7851KR-REEL 0°C to 85°C ±1 285 238 SOIC R-24
AD7851KRZ
3
0°C to 85°C ±1 285 238 SOIC R-24
AD7851KRZ-REEL
3
0°C to 85°C ±1 285 238 SOIC R-24
AD7851ARS –40°C to +85°C ±2 333 238 SSOP RS-24
AD7851ARS-REEL –40°C to +85°C ±2 333 238 SSOP RS-24
EVAL-AD7851CB
4
Evaluation Board
EVAL-CONTROL BRD2
5
Controller Board
NOTES
1
Both A and K Grades are guaranteed up to 125°C, but at a lower throughput of 238 kHz (5 MHz).
2
Linearity error refers to the integral linearity error.
3
Z = Pb-free part.
4
This can be used as a standalone evaluation board or in conjunction with the EVAL-CONTROL BOARD for evaluation/demonstration purposes.
5
This board is a complete unit allowing a PC to control and communicate with all Analog Devices, Inc. evaluation boards ending in the CB designators. To order a
complete evaluation kit, the particular ADC evaluation board needs to be ordered, e.g., EVAL-AD7851CB, the EVAL-CONTROL BRD2, and a 12 V ac trans-
former. See the Evaluation Board application note for more information.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although the
AD7851 features proprietary ESD protection circuitry, permanent damage may occur on devices
subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended
to avoid performance degradation or loss of functionality.
Lead Temperature, Soldering
Vapor Phase (60 secs) . . . . . . . . . . . . . . . . . . . . . . . 215°C
Infrared (15 secs) . . . . . . . . . . . . . . . . . . . . . . . . . . 220°C
ESD . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >1.5 kV
NOTES
1
Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
2
Transient currents of up to 100 mA will not cause SCR latch-up.