Datasheet

AD7575
–3–
REV. B
TIMING SPECIFICATIONS
1
Limit at +25ⴗC Limit at T
MIN
, T
MAX
Limit at T
MIN
, T
MAX
Parameter (All Versions) (J, K, A, B Versions) (S, T Versions) Units Conditions/Comments
t
1
0 0 0 ns min CS to RD Setup Time
t
2
100 100 120 ns max RD to BUSY Propagation Delay
t
3
2
100 100 120 ns max Data Access Time after RD
t
4
100 100 120 ns min RD Pulse Width
t
5
0 0 0 ns min CS to RD Hold Time
t
6
2
80 80 100 ns max Data Access Time after BUSY
t
7
3
10 10 10 ns min Data Hold Time
80 80 100 ns max
t
8
0 0 0 ns min BUSY to CS Delay
NOTES
1
Timing specifications are sample tested at +25°C to ensure compliance. All input control signals are specified with tr = tf = 20 ns (10% to 90% of +5 V)
and timed from a voltage level of 1.6 V.
2
t
3
and t
6
are measured with the load circuits of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.
3
t
7
is defined as the time required for the data lines to change 0.5 V when loaded with the circuits of Figure 2.
Specifications subject to change without notice.
(V
DD
= +5 V, V
REF
= +1.23 V, AGND = DGND = 0 V)
Test Circuits
ABSOLUTE MAXIMUM RATINGS*
V
DD
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +7 V
V
DD
to DGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, +7 V
AGND to DGND . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, V
DD
Digital Input Voltage to DGND . . . . . . . –0.3 V, V
DD
+ 0.3 V
Digital Output Voltage to DGND . . . . . . –0.3 V, V
DD
+ 0.3 V
CLK Input Voltage to DGND . . . . . . . . . –0.3 V, V
DD
+ 0.3 V
V
REF
to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, V
DD
AIN to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V, V
DD
Operating Temperature Range
Commercial (J, K Versions) . . . . . . . . . . . . . . 0°C to +70°C
Industrial (A, B Versions) . . . . . . . . . . . . . –25°C to +85°C
Extended (S, T Versions) . . . . . . . . . . . . . –55°C to +125°C
Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . +300°C
Power Dissipation (Any Package) to +75°C . . . . . . . 450 mW
Derates above +75°C by . . . . . . . . . . . . . . . . . . . . . 6 mW/°C
*Stresses above those listed under Absolute Maximum Ratings may cause perma-
nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect device reliability.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection.
Although the AD7575 features proprietary ESD protection circuitry, permanent damage may
occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD
precautions are recommended to avoid performance degradation or loss of functionality.
b High-Z to V
OL
a. High-Z to V
OH
Figure 1. Load Circuits for Data Access Time Test Figure 2. Load Circuits for Data Hold Time Test
a. V
OH
to High-Z b. V
OL
to High-Z
WARNING!
ESD SENSITIVE DEVICE
DGND
3kV 100pF
DBN
DGND
3kV
100pF
DBN
+5V
DGND
3kV 10pF
DBN
DGND
3kV
10pF
DBN
+5V