Datasheet

AD7457
Rev. A | Page 3 of 20
SPECIFICATIONS
V
DD
= 2.7 V to 5.25 V, f
SCLK
= 10 MHz, f
S
= 100 kSPS, V
REF
= 2.5 V, T
A
= T
MIN
to T
MAX
, unless otherwise noted.
Table 1.
Parameter Test Conditions/Comments B Version
1
Unit
DYNAMIC PERFORMANCE f
IN
= 30 kHz
Signal to Noise Ratio (SNR)
2
71 dB min
Signal to (Noise + Distortion) (SINAD)
2
70 dB min
Total Harmonic Distortion (THD)
2
−84 dB typ −75 dB max
Peak Harmonic or Spurious Noise
2
−86 dB typ −75 dB max
Intermodulation Distortion (IMD)
2
fa = 25 kHz; fb = 35 kHz
Second-Order Terms −80 dB typ
Third-Order Terms −80 dB typ
Aperture Delay
2
5 ns typ
Aperture Jitter
2
50 ps typ
Full-Power Bandwidth
2, 3
@ −3 dB 20 MHz typ
@ −0.1 dB 2.5 MHz typ
DC ACCURACY
Resolution 12 Bits
Integral Nonlinearity (INL)
2
±1 LSB max
Differential Nonlinearity (DNL)
2
Guaranteed no missed codes to 12 bits ±0.95 LSB max
Offset Error
2
±4.5 LSB max
Gain Error
2
±2 LSB max
ANALOG INPUT
Full-Scale Input Span
V
IN+
− V
IN−
V
REF
V
Absolute Input Voltage
V
IN+
V
REF
V
V
IN−
4
V
DD
= 2.7 V to 3.6 V −0.1 to +0.4 V
V
DD
= 4.75 V to 5.25 V −0.1 to +1.5 V
DC Leakage Current ±1 µA max
Input Capacitance When in track/hold 30/10 pF typ
REFERENCE INPUT
V
REF
Input Voltage
5
±1% tolerance for specified performance 2.5 V
DC Leakage Current ±1 µA max
V
REF
Input Capacitance When in track/hold 10/30 pF typ
LOGIC INPUTS
Input High Voltage, V
INH
2.4 V min
Input Low Voltage, V
INL
0.8 V max
Input Current, I
IN
Typically 10 nA, V
IN
= 0 V or V
DD
±1 µA max
Input Capacitance, C
IN
6
10 pF max
LOGIC OUTPUTS
Output High Voltage, V
OH
V
DD
= 4.75 V to 5.25 V, I
SOURCE
= 200 µA 2.8 V min
V
DD
= 2.7 V to 3.6 V, I
SOURCE
= 200 µA 2.4 V min
Output Low Voltage, V
OL
I
SINK
= 200 µA 0.4 V max
Floating-State Leakage Current ±1 µA max
Floating-State Output Capacitance
6
10 pF max
Output Coding Straight natural binary
CONVERSION RATE
Conversion Time 1.6 µs with a 10 MHz SCLK 16 SCLK cycles
Track-and-Hold Acquisition Time
2
1 µs max
Throughput Rate See the Serial Interface section 100 kSPS max