Datasheet

AD7292 Data Sheet
Rev. 0 | Page 4 of 40
Parameter Min Typ Max Unit Test Conditions/Comments
EXTERNAL REFERENCE
Reference Input Voltage 4.75 AV
DD
V Internal reference used to calibrate
temperature sensor
Input Resistance 100 kΩ
1
Specifications also apply to differential mode.
DAC SPECIFICATIONS
AV
DD
= 4.75 V to 5.25 V, DV
DD
= 1.8 V to 5.25 V, V
REF
= 1.25 V internal, V
DRIVE
= 1.8 V to 5.25 V, A
GND
= 0 V, T
A
= −40°C to +125°C,
unless otherwise noted.
Table 2.
Parameter Min Typ Max Unit Test Conditions/Comments
DC ACCURACY
Resolution 10 Bits
Integral Nonlinearity (INL) ±0.2 ±1 LSB
Differential Nonlinearity (DNL) ±0.1 ±0.3 LSB Guaranteed monotonic
Zero-Scale Error 4.8 ±10 mV All 0s loaded to DAC register
Full-Scale Error ±0.1 ±0.5 % FS All 1s loaded to DAC register
Offset Error ±1.62 ±10 mV Measured in the linear region,
T
A
= −40°C to +125°C
Offset Error Drift ±4.4 ppm/°C Measured in the linear region, T
A
= 25°C
Gain Error ±0.35 ±0.5 % FS
Gain Error Drift ±2.6 ppm/°C
DC Power Supply Rejection Ratio (PSRR) −50 dB f
RIPPLE
up to 100 kHz
DC Crosstalk 5 μV
DAC OUTPUT CHARACTERISTICS
Output Voltage Range 0 4 × V
REF
V
Short-Circuit Current ±30 mA
Load Current ±10 mA Sink/source current; within ±200 mV
of supply
Resistive Load to A
GND
500 Ω
Capacitive Load Stability 1 nF
DC Output Impedance 1 Ω
AC CHARACTERISTICS
1
Output Voltage Settling Time 1 2 µs ¼ to ¾ scale step change within 1 LSB,
measured from last SCLK edge
Overshoot 200 mV ¼ to ¾ scale step change within 1 LSB,
measured from last SCLK edge;
C
L
= 200 pF, R
L
= 25 kΩ
Slew Rate 9 12 V/µs
Digital-to-Analog Glitch Impulse 4 nV-sec
Digital Feedthrough 0.4 nV-sec
DAC-to-DAC Crosstalk 2 nV-sec
Output Noise Spectral Density 730 nV/√Hz DAC code = midscale, 1 kHz
Output Noise 28 μV rms 0.1 Hz to 10 Hz
Output Transient Response During
Power-Up
5 mV AV
DD
ramp of 1 ms with 100 kΩ load
1
The DAC buffer output level is undefined until 30 µs after all supplies reach their minimum specified operating voltages.