Datasheet

AD5570
Rev. C | Page 3 of 24
SPECIFICATIONS
V
DD
= +11.4 V to +16.5 V, V
SS
= −11.4 V to −16.5 V, V
REF
= 5 V, REFGND = AGND = DGND = 0 V, R
L
= 5 kΩ, C
L
= 200 pF to AGND;
all specifications T
MIN
to T
MAX
, unless otherwise noted.
Table 1.
Parameter
1
Min Typ
2
Max
Unit Test Conditions/Comments
ACCURACY
Resolution 16 Bits
Monotonicity 16 Bits
Differential Nonlinearity (DNL) −1 ±0.3 +1 LSB
Relative Accuracy (INL)
B/Y Grade −1 ±0.4 +1 LSB
A/W Grade −2 ±0.6 +2 LSB
Positive INL Drift Over Time
3
See Figure 16
A/B Grades 2.5 ppm
W/Y Grades 6.5 ppm
Negative Full-Scale Error ±0.9 ±7.5 mV
Full-Scale Error ±1.8 ±6 mV
Bipolar Zero Error ±0.9 ±7.5 mV
Gain Error ±1.8 ±7.5 mV
Gain Temperature Coefficient
4
+0.25 ±1.5 ppm FSR/°C
REFERENCE INPUT
Reference Input Range
4
4 5 5 V With ±11.4 V supplies
4 5 7 V With ±16.5 V supplies
Input Current ±0.1 μA
OUTPUT CHARACTERISTICS
4
Output Voltage Range V
SS
+ 1.4 V
DD
− 1.4 V With ±11.4 V supplies
V
SS
+ 2.5 V
DD
− 2.5 V With ±16.5 V supplies
Output Voltage Settling Time 12 16 μs At 16 bits to ±0.5 LSB
10 13 μs To 0.0003%
6 7 μs 512 LSB code change
Slew Rate 6.5 V/μs Measured from 10% to 90%
Digital-to-Analog Glitch Impulse 15 nV-s
±12 V supplies; 1 LSB change around
the major carry
Bandwidth 20 kHz
Short Circuit Current 25 mA
Output Noise Voltage Density 85 nV/Hz f = 1 kHz; midscale loaded
DAC Output Impedance 0.35 0.5 Ω
Digital Feedthrough 0.5 nV-s
WARMUP TIME
5
12 sec
LOGIC INPUTS
Input Currents ±0.1 μA
V
INH
, Input High Voltage 2 V
V
INL
, Input Low Voltage 0.8 V
C
IN
, Input Capacitance 3 pF
LOGIC OUTPUTS
V
OL
, Output Low Voltage 0.4 V I
SINK
= 1 mA
Floating-State Output 8 pF