Datasheet

Data Sheet AD5410/AD5420
Rev. F | Page 5 of 32
Parameter
1
Min Typ Max Unit Test Conditions/Comments
Output Impedance 50 MΩ
Output Current Leakage 60 pA Output disabled
R3 Resistor Value 36 40 44 Ω T
A
= 25°C
R3 Resistor Temperature Coefficient (TC) 30 ppm/°C
I
BIAS
Current 399 444 489 µA
I
BIAS
Current Temperature Coefficient (TC) 30 ppm/°C
REFERENCE INPUT/OUTPUT
Reference Input
3
Reference Input Voltage 4.95 5 5.05 V For specified performance
DC Input Impedance 25 30 kΩ
Reference Output
Output Voltage 4.995 5.000 5.005 V T
A
= 25°C
Reference TC
3, 4
1.8 10 ppm/°C
Output Noise (0.1 Hz to 10 Hz)
3
18 µV p-p
Noise Spectral Density
3
100 nV/√Hz At 10 kHz
Output Voltage Drift vs. Time
3
50 ppm Drift after 1000 hours, T
A
= 125°C
Capacitive Load
3
600 nF
Load Current
3
5
mA
Short-Circuit Current
3
7 mA
Load Regulation
3
95 ppm/mA
DIGITAL INPUTS
3
JEDEC compliant
Input High Voltage, V
IH
2 V
Input Low Voltage, V
IL
0.8 V
Input Current −1 +1 µA Per pin
Pin Capacitance 10 pF Per pin
DIGITAL OUTPUTS
3
SDO
Output Low Voltage, V
OL
0.4 V Sinking 200 µA
Output High Voltage, V
OH
DV
CC
− 0.5 V Sourcing 200 µA
High Impedance Leakage Current −1 +1 µA
High Impedance Output Capacitance 5 pF
FAULT
Output Low Voltage, V
OL
0.4 V 10 kΩ pull-up resistor to DV
CC
Output Low Voltage, V
OL
0.6 V 2.5 mA load current
Output High Voltage, V
OH
3.6 V 10 kΩ pull-up resistor to DV
CC
POWER REQUIREMENTS
AV
DD
10.8
40
V
TSSOP package
10.8 60 V LFCSP package
DV
CC
Input Voltage 2.7 5.5 V Internal supply disabled
Output Voltage 4.5 V DV
CC
can be overdriven up to 5.5 V
Output Load Current
3
5 mA
Short-Circuit Current
3
20 mA
AI
DD
3 mA Output disabled
4
mA
Output enabled
DI
CC
1 mA V
IH
= DV
CC
, V
IL
= GND
Power Dissipation 144 mW AV
DD
= 40 V, I
OUT
= 0 mA
50 mW AV
DD
= 15 V, I
OUT
= 0 mA
1
Temperature range: −40°C to +85°C; typical at +25°C.
2
For 0 mA to 20 mA and 0 mA to 24 mA ranges, INL is measured from Code 256 for the AD5420 and Code 16 for the AD5410.
3
Guaranteed by design and characterization but not production tested.
4
The on-chip reference is production trimmed and tested at 25°C and 85°C. It is characterized from −40°C to +85°C.