Datasheet

AD5379
Rev. B | Page 27 of 28
TYPICAL APPLICATION CIRCUIT
The high channel count of the AD5379 makes it well-suited to
applications requiring high levels of integration such as optical
and automatic test equipment (ATE) systems. Figure 22 shows
the AD5379 as it would be used in an ATE system. Shown here
is one pin of a typical logic tester. It is apparent that a number of
discrete levels are required for the pin driver, active load circuit,
parametric measurement unit, comparators, and clamps.
In addition to the DAC levels required in the ATE system as
shown in Figure 22, drivers, loads, comparators, and parametric
measurement unit functions are also required. Analog Devices
provides solutions for all these functions.
DAC
CENTRAL PMU
DRIVEN SHIELD
V
CH
V
TH
V
TL
I
OL
V
COM
I
OH
V
CL
V
H
V
L
DRIVER
COMP
ACTIVE LOAD
FORMATTER DE-SKEW
COMPARE
MEMORY
TIMING DATA
MEMORY
TIMING
GENERATOR
DLL LOGIC
FORMATTER DE-SKEW
V
TERM
PPMU
RELAYS
GND SENSE
DEVICE POWER
SUPPLY
50
Ω COAX
DUT
GUARD AMP
DAC
DAC
DAC
DAC
DAC
DAC
DAC
DAC
DAC
DAC
ADC
DAC
ADC
DAC
ADC
03165-022
Figure 22. Typical Application Circuit for Logic Tester