Datasheet

AD5372/AD5373
Rev. C | Page 5 of 28
Parameter
AD5372
1
B Version
AD5373
1
B Version Unit Test Conditions/Comments
2
POWER REQUIREMENTS
DV
CC
2.5/5.5 2.5/5.5 V min/V max
V
DD
9/16.5 9/16.5 V min/V max
V
SS
−16.5/−4.5 −16.5/−4.5 V min/V max
Power Supply Sensitivity
2
∆Full Scale/∆V
DD
−75 −75 dB typ
∆Full Scale/∆V
SS
−75 −75 dB typ
∆Full Scale/∆DV
CC
−90 −90 dB typ
DI
CC
2 2 mA max DV
CC
= 5.5 V, V
IH
= DV
CC
, V
IL
= GND
I
DD
16 16 mA max Outputs unloaded, DAC outputs = 0 V
18 18 mA max Outputs unloaded, DAC outputs = full scale
I
SS
−16 −16 mA max Outputs unloaded, DAC outputs = 0 V
−18 −18 mA max Outputs unloaded, DAC outputs = full scale
Power-Down Mode Bit 0 in the control register is 1
DI
CC
5 5 μA typ
I
DD
35 35 μA typ
I
SS
−35 −35 μA typ
Power Dissipation (Unloaded) 250 250 mW typ V
SS
= −8 V, V
DD
= 9.5 V, DV
CC
= 2.5 V
Junction Temperature
3
130 130 °C max T
J
= T
A
+ P
TOTAL
× θ
JA
1
Temperature range for B version: −40°C to +85°C. Typical specifications are at 25°C.
2
Guaranteed by design and characterization; not production tested.
3
θ
JA
represents the package thermal impedance.
AC CHARACTERISTICS
DV
CC
= 2.5 V; V
DD
= 15 V; V
SS
= −15 V; VREF0 = VREF1 = 3 V; AGND = DGND = SIGGNDx = 0 V; C
L
= 200 pF; R
L
= 10 kΩ; gain (M),
offset (C), and DAC offset registers at default values; all specifications T
MIN
to T
MAX
, unless otherwise noted.
Table 3.
Parameter B Version Unit Test Conditions/Comments
DYNAMIC PERFORMANCE
1
Output Voltage Settling Time 20 μs typ Full-scale change
30 μs max DAC latch contents alternately loaded with all 0s and all 1s
Slew Rate 1 V/μs typ
Digital-to-Analog Glitch Energy 5 nV-s typ
Glitch Impulse Peak Amplitude 10 mV max
Channel-to-Channel Isolation 100 dB typ VREF0, VREF1 = 2 V p-p, 1 kHz
DAC-to-DAC Crosstalk 10 nV-s typ
Digital Crosstalk 0.2 nV-s typ
Digital Feedthrough 0.02 nV-s typ Effect of input bus activity on DAC output under test
Output Noise Spectral Density @ 10 kHz 250 nV/√Hz typ VREF0 = VREF1 = 0 V
1
Guaranteed by design and characterization; not production tested.