Datasheet
Data Sheet AD5310
Rev. B | Page 3 of 16
SPECIFICATIONS
V
DD
= 2.7 V to 5.5 V; temperature range = −40°C to +105°C R
L
= 2 kΩ to GND; C
L
= 500 pF to GND; all specifications T
MIN
to T
MAX
unless
otherwise noted
Table 1.
Parameter Min Typ Max Unit Test Conditions/Comments
STATIC PERFORMANCE
1
Resolution 10 Bits
Relative Accuracy ±4 LSB See Figure 5
Differential Nonlinearity ±0.5 LSB Guaranteed monotonic by design (see Figure 6)
Zero Code Error 5 40 mV All 0s loaded to DAC register (see Figure 9)
Full-Scale Error
−0.15
−1.25
% of FSR
All 1s loaded to DAC register (see Figure 9)
Gain Error ±1.25 % of FSR
Zero Code Error Drift −20 µV/°C
Gain Temperature Coefficient −5 ppm of FSR/°C
OUTPUT CHARACTERISTICS
2
Output Voltage Range 0 V
DD
V
Output Voltage Settling Time 6 8 µs ¼ scale to ¾ scale change (100 hex to 300 hex)
Slew Rate 1 V/µs R
L
= 2 kΩ; 0 pF < C
L
< 500 pF (see Figure 19)
Capacitive Load Stability 470 pF R
L
= ∞
1000
pF
R
L
= 2 kΩ
Digital-to-Analog Glitch Impulse 20 nV-s 1 LSB change around major carry (see Figure 22)
Digital Feedthrough 0.5 nV-s
DC Output Impedance 1 Ω
Short-Circuit Current 50 mA V
DD
= 5 V
20
mA
V
DD
= 3 V
Power-Up Time 2.5 µs Coming out of power-down mode, V
DD
= 5 V
5 µs Coming out of power-down mode, V
DD
= 3 V
LOGIC INPUTS
2
Input Current ±1 µA
V
INL
, Input Low Voltage 0.8 V V
DD
= 5 V
V
INL
, Input Low Voltage 0.6 V V
DD
= 3 V
V
INH
, Input High Voltage 2.4 V V
DD
= 5 V
V
INH
, Input High Voltage 2.1 V V
DD
= 3 V
Pin Capacitance
3
pF
POWER REQUIREMENTS
V
DD
2.7 5.5 V
I
DD
(Normal Mode) DAC active and excluding load current
V
DD
= 4.5 V to 5.5 V 140 250 µA V
IH
= V
DD
and V
IL
= GND
V
DD
= 2.7 V to 3.6 V 115 200 µA V
IH
= V
DD
and V
IL
= GND
I
DD
(All Power-Down Modes)
V
DD
= 4.5 V to 5.5 V 0.2 1 µA V
IH
= V
DD
and V
IL
= GND
V
DD
= 2.7 V to 3.6 V 0.05 1 µA V
IH
= V
DD
and V
IL
= GND
Power Efficiency
I
OUT
/I
DD
93 % I
LOAD
= 2 mA, V
DD
= 5 V
1
Linearity calculated using a reduced code range of 12 to 1011. Output unloaded.
2
Guaranteed by design and characterization; not production tested.