Datasheet

Data Sheet AD5263
Rev. F | Page 13 of 28
TEST CIRCUITS
Figure 29 to Figure 39 define the test conditions used in the Electrical Characteristics—20 KΩ, 50 KΩ, 200 KΩ Versions section and the
Timing Characteristics—20 KΩ, 50 KΩ, 200 KΩ Versions.
03142-028
V
MS
A
W
B
DUT
V+
V+ = V
DD
1LSB = V+/2
N
Figure 29. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
03142-029
NO CONNECT
I
W
V
MS
A
W
B
DUT
Figure 30. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
03142-030
V
MS1
V
MS2
V
W
A
W
B
DUT
R
W
= [V
MS1
– V
MS2
]/I
W
I
W
= V
DD
/R
NOMINAL
Figure 31. Test Circuit for Wiper Resistance
03142-031
ΔV
MS
%
DD
%
PSS (%/%) =
V+ = V
DD
10%
PSRR (dB) = 20 log
MS
DD
V
DD
V
A
V
MS
A
W
B
V+
ΔV
ΔV
ΔV
Figure 32. Test Circuit for Power Supply Sensitivity (PSS, PSRR)
03142-032
OP279
W
5V
B
V
OUT
OFFSET
GND
OFFSET
BIAS
DUT
V
IN
A
Figure 33. Test Circuit for Inverting Gain
03142-033
B
A
V
IN
OP279
W
5V
V
OUT
OFFSET
GND
OFFSET
BIAS
DUT
Figure 34. Test Circuit for Noninverting Gain
03142-034
+15V
–15V
W
A
2.5V
B
V
OUT
OFFSET
GND
DUT
AD8610
V
IN
Figure 35. Test Circuit for Gain vs. Frequency
03142-035
W
B
V
SS
TO V
DD
DUT
I
SW
CODE = 0x00
R
SW
=
0.1V
I
SW
0.1V
Figure 36. Test Circuit for Incremental On Resistance