Datasheet

Data Sheet AD5259
Rev. C | Page 13 of 24
TEST CIRCUITS
Figure 32 through Figure 37 illustrate the test circuits that define the test conditions used in the product Specifications tables.
05026-030
V
MS
A
W
B
DUT
V+
V+ = V
DD
1LSB = V+/2
N
Figure 32. Test Circuit for Potentiometer Divider Nonlinearity Error (INL, DNL)
05026-031
NO CONNECT
I
W
V
MS
A
W
B
DUT
Figure 33. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
05026-032
V
MS2
V
MS1
V
W
A
W
B
DUT
I
W
= V
DD
/R
NOMINAL
R
W
= [V
MS1
– V
MS2
]/I
W
Figure 34. Test Circuit for Wiper Resistance
05026-033
∆V
MS
%
DUT
( )
A
W
B
V+
∆V
DD
%
∆V
MS
∆V
DD
∆V
DD
V
A
V
MS
V+ = V
DD
± 10%
PSRR (dB) = 20 LOG
PSS (%/%) =
Figure 35. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
05026-034
+5V
–5V
W
A
+2.5V
B
V
OUT
OFFSET
GND
DUT
AD8610
V
IN
Figure 36. Test Circuit for Gain vs. Frequency
05026-035
W
B
DUT
I
SW
I
SW
R
SW
GND TO V
DD
CODE = 0x00
=
0.1V
0.1V
Figure 37. Test Circuit for Common-Mode Leakage Current