Datasheet

AD5245
Rev. B | Page 12 of 20
TEST CIRCUITS
Figure 28 to Figure 34 illustrate the test circuits that define the test conditions used in the product specification tables (Table 1 through Table 3).
V
MS
A
W
B
DUT
V+
V+ = V
DD
1LSB = V+/2
N
03436-027
Figure 28. Test Circuit for Potentiometer Divider Nonlinearity Error
(INL, DNL)
NO CONNECT
I
W
V
MS
A
W
B
DUT
03436-028
Figure 29. Test Circuit for Resistor Position Nonlinearity Error
(Rheostat Operation; R-INL, R-DNL)
V
MS2
V
MS1
V
W
A
W
B
DUT
I
W
= V
DD
/R
NOMINAL
R
W
= [V
MS1
– V
MS2
]/I
W
03436-029
Figure 30. Test Circuit for Wiper Resistance
∆V
MS
%
DD
%
PSS (%/%) =
V+ = V
DD
±10%
PSRR (dB) = 20 log
MS
DD
( )
V
DD
V
A
V
MS
A
W
B
V+
∆V
∆V
∆V
03436-030
Figure 31. Test Circuit for Power Supply Sensitivity (PSS, PSSR)
+15V
–15V
W
A
2.5V
B
V
OUT
OFFSET
GND
DUT
AD8610
V
IN
03436-031
Figure 32. Test Circuit for Gain vs. Frequency
W
B
GND TO V
DD
DUT
I
SW
CODE = 0x00
R
SW
=
0.1
V
I
SW
0.1V
03436-032
Figure 33. Test Circuit for Incremental On Resistance
W
B
V
CM
I
CM
A
NC
GND
NC
V
DD
DUT
NC = NO CONNECT
03436-033
Figure 34. Test Circuit for Common-Mode Leakage Current